1996
DOI: 10.1016/0022-0248(95)01015-7
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Parametric study on lattice-matched and pseudomorphic InGaAs/InAlAs/InP modulation-doped heterostructures grown by GSMBE

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Cited by 9 publications
(3 citation statements)
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“…Figure 3 shows electron mobility at 77 K of the ͑411͒A In 0.74 Ga 0.26 As/ In 0.46 Al 0.54 As MD-QW plotted as a function of sheet electron concentration of 2DEG. Electron mobilities ͑77 K͒ of the (100) reference sample ͑y = 0.54͒ and other (100) InGaAs/ InAlAs MD-QWs reported so far [10][11][12][13][14][15][16][17][18][19][20][21] are also plotted in Fig. 3.…”
mentioning
confidence: 99%
“…Figure 3 shows electron mobility at 77 K of the ͑411͒A In 0.74 Ga 0.26 As/ In 0.46 Al 0.54 As MD-QW plotted as a function of sheet electron concentration of 2DEG. Electron mobilities ͑77 K͒ of the (100) reference sample ͑y = 0.54͒ and other (100) InGaAs/ InAlAs MD-QWs reported so far [10][11][12][13][14][15][16][17][18][19][20][21] are also plotted in Fig. 3.…”
mentioning
confidence: 99%
“…Experimental [5] and theoretical [3,6] evidence suggest that the performance of such devices may be improved by full or partial relaxation of the channel strain. The relative values of the lattice constants of 111-V materials indicate that channel relaxation may be achieved by using thick InAlAs as a strain-relief buffer or a virtual substrate.…”
Section: Methodology and Device Architecturementioning
confidence: 99%
“…Handling the fragile InP substrate presents additional technological problems. An alternative approach is to use 'virtual substrates' where relaxed InAlAs buffers are grown on conventional GaAs wafers to match various channel lattice constants [5].…”
Section: Introductionmentioning
confidence: 99%