2010
DOI: 10.1889/jsid18.2.164
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Parameters influencing exo‐electron emission currents from MgO film of ACPDPs

Abstract: Abstract— A theoretical model of exo‐electron emission kinetics was developed by considering back‐diffusion and the gas‐amplification phenomena. Using the model, the effects of temperature, trapped electron concentration, trap energy level, and trap concentration on the exo‐electron currents were predicted and compared with experimental results. The theoretically predicted values agreed reasonably well with the trends of the measured results.

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Cited by 3 publications
(1 citation statement)
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“…3 Exoemission decays significantly with time after the last discharge with different time profiles which depend on the MgO impurity and defect levels, 4 and on temperature. 5,6 The level of exoemission also depends on the amount of discharge excitation that might occur from sustaining discharges or from reset discharges. Ideally, the intensity of the reset discharges can be carefully adjusted to excite enough exoemission for reliable high-speed addressing and at the same time generate only low levels of background glow necessary for high dark-room contrast ratios.…”
Section: Introductionmentioning
confidence: 99%
“…3 Exoemission decays significantly with time after the last discharge with different time profiles which depend on the MgO impurity and defect levels, 4 and on temperature. 5,6 The level of exoemission also depends on the amount of discharge excitation that might occur from sustaining discharges or from reset discharges. Ideally, the intensity of the reset discharges can be carefully adjusted to excite enough exoemission for reliable high-speed addressing and at the same time generate only low levels of background glow necessary for high dark-room contrast ratios.…”
Section: Introductionmentioning
confidence: 99%