Parallel detection, quantification, and depth profiling of peptides with dynamic-secondary ion mass spectrometry (D-SIMS) ionized by C60+–Ar+ co-sputtering

Rapid label-free determination of ketamine in whole blood using secondary ion mass spectrometry

“…Alternatively, secondary ion mass spectrometry (SIMS), which sputters a specimen surface by ion bombardment has been emerged to identify target analytes on the biological samples. SIMS is capable of providing lateral resolution and imaging sensitivity on the order of parts-per-million [25][26][27][28][29][30][31][32]. SIMS is regarded as one of the most important microanalytical tools in the semiconductor material industry for analyzing trace amount of dopants and organic impurities.…”

Effects of the temperature and beam parameters on depth profiles in X-ray photoelectron spectrometry and secondary ion mass spectrometry under C60+–Ar+ cosputtering

“…However, slight enhancements of the SIMS signals were observed near the PMMA/silica interface. On a silicon substrate with a native oxide layer, this interfacial enhancement was usually observed [46] and can be explained as oxygen enhancement [47,48]. However, this enhancement was not observed when there was a thick thermo-oxide (silica) layer at the interface in cosputtering (Fig.…”

Imaging Mass Spectrometric Analysis of Neurotransmitters

“…41) Moreover, the number of available matrices exhibiting light absorbance and proton donation-necessary features to achieve both high sensitivity and sample ionisation-is still very small. 42) In addition, the presence in tissues samples of other biomolecules such as lipids can hinder visualisation of the neuropeptide distribution in intact, untreated brain tissues, due to the interference of signals. To extract lipids and improve the detection of neuropeptides, brain tissue sections can be washed with organic solvents, 43) but this procedure can relocate proteins and peptides.…”

“…Indeed, following a collision with the sample surface, cluster ions such as C 60+ , Bi 3+ , Au 3+ , and SF 5+ break up in intact ions but the energy produced dissipates rapidly. 42) Hence, according to Chang et al, each ion contains only low energy and cannot penetrate profoundly into the surface. e energy retained on the surface is then used to enhance secondary ion production.…”