2003
DOI: 10.1016/s0168-583x(03)01123-6
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Oxygen analysis using energetic ion beams

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Cited by 12 publications
(3 citation statements)
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“…This is in contrast with the carbon film on glass 6 and the SiO 2 film on Si, 7 which slowly eroded during ion beam bombardments. The error source for this experiment arises primarily from the counting statistics and background subtraction.…”
Section: Analytical Proceduresmentioning
confidence: 89%
“…This is in contrast with the carbon film on glass 6 and the SiO 2 film on Si, 7 which slowly eroded during ion beam bombardments. The error source for this experiment arises primarily from the counting statistics and background subtraction.…”
Section: Analytical Proceduresmentioning
confidence: 89%
“…Besides, to interpret the experimental data, in theoretical approach some efforts have been made [6][7][8]. Even though the majority of available data, are differential cross sections in backward angles [9][10][11], a few data relating to the angular distribution are published [6,7]. In 1973, Cavallaro measured the angular distribution of the mentioned reactions (with deuteron beams with energy below 2 MeV).…”
Section: Introductionmentioning
confidence: 99%
“…The cross-sections for the analysis of oxygen using16 O(d, p 1 ) 17 O, 16 O(d, α) 14 N, 16 O(α, α)16 O over energies ranging from 0.701 to1.057 MeV for d + ions and 2.949 to3.049 MeV for H + ions have been reported byJiang et al (2003). containing oxygen.…”
mentioning
confidence: 99%