“…However, the demand on new SPEM systems will essentially depend on the scientific merit. The already existing systems have recently been applied to investigate the local electronic structure of various semiconductor nanostructures, such as GaN nanowires [42], ZnO nanorods [43,44], AlN nanotips [45], and focused-laser-treated CNTs [36], and the atomic force microscopy (AFM)-induced formation of silicon oxide pad [38,46] or silicon carbide nanowires [47]. Other studies included the dynamics of surface chemical processes on catalytic transition metal surfaces [48,49], the defect formation in organic light-emitting devices [50], the spatial chemical inhomogeneity of ferromagnetic semiconductors [51], and the band alignment of the in situ cleaved InN/GaN heterostructure [52].…”