2012 10th IEEE International Conference on Semiconductor Electronics (ICSE) 2012
DOI: 10.1109/smelec.2012.6417229
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Oxidation on copper lead frame surface which leads to package delamination

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“…Learnings from this manuscript combined with other ideas mentioned in the literature and in [8][9][10][11][12] would help reinforce and promote a lean and robust manufacturing on all branches of industry.…”
Section: Conclusion and Recommenda-tionsmentioning
confidence: 97%
“…Learnings from this manuscript combined with other ideas mentioned in the literature and in [8][9][10][11][12] would help reinforce and promote a lean and robust manufacturing on all branches of industry.…”
Section: Conclusion and Recommenda-tionsmentioning
confidence: 97%