2021
DOI: 10.1016/j.matlet.2020.129058
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Optimization of Reactive-Ion Etching (RIE) parameters to maximize the lateral etch rate of silicon using SF6/N2 gas mixture: An alternative to etching Si in MEMS with Au components

Abstract: In this work, the effects of the N2 addition to the SF6 plasma used in the isotropic silicon etching of Microelectromechanical systems (MEMS) with Au components are investigated. A four-variables Doehlert design was implemented for optimizing the etching parameters (power, pressure, gas flow rate, and N2/SF6 ratio) to maximize the lateral etch rate of Si using SF6/N2 gas mixture. The optimized etch condition founded for a lateral etch rate of 1.8 µm/min was: power=143 W, chamber pressure=86 mTorr, flow rate=22… Show more

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Cited by 3 publications
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“…hBN was first exfoliated on a clean SiO 2 substrate and then transferred on top of the bottom electrode (Figure a,e) with a stamp made from a polydimethylsiloxane (PDMS) block and a polycarbonate (PC) film. , After top contact patterning (Figure b,f), the sandwiched hBN layer was isotropically removed via reactive ion etching (RIE) to form an underetched region of width d c between the top and bottom electrode (Figure c,g). Using SF 6 as the process gas increases the etch isotropy and hence lateral etching rate in the normally vertical directed RIE due to a high density of SF 5 * and F* radicals, which in turn are responsible for bulk etching. The process steps, including spin-coating of the donor–acceptor polymer poly­(diketopyrrolopyrrole-terthiophene) (PDPP), removal of PDPP via directional RIE, and deposition of the ionic liquid 1-ethyl-3-methylimidazolium bis­(trifluoromethylsulfonyl)­imide ([EMIM]­[TFSI]) as the gate electrode, complete the devices . Using ionic liquids as gate care should be taken to not exceed the electrochemical window which is defined by the difference between the oxidation and reduction potential of cations and anions.…”
Section: Resultsmentioning
confidence: 99%
“…hBN was first exfoliated on a clean SiO 2 substrate and then transferred on top of the bottom electrode (Figure a,e) with a stamp made from a polydimethylsiloxane (PDMS) block and a polycarbonate (PC) film. , After top contact patterning (Figure b,f), the sandwiched hBN layer was isotropically removed via reactive ion etching (RIE) to form an underetched region of width d c between the top and bottom electrode (Figure c,g). Using SF 6 as the process gas increases the etch isotropy and hence lateral etching rate in the normally vertical directed RIE due to a high density of SF 5 * and F* radicals, which in turn are responsible for bulk etching. The process steps, including spin-coating of the donor–acceptor polymer poly­(diketopyrrolopyrrole-terthiophene) (PDPP), removal of PDPP via directional RIE, and deposition of the ionic liquid 1-ethyl-3-methylimidazolium bis­(trifluoromethylsulfonyl)­imide ([EMIM]­[TFSI]) as the gate electrode, complete the devices . Using ionic liquids as gate care should be taken to not exceed the electrochemical window which is defined by the difference between the oxidation and reduction potential of cations and anions.…”
Section: Resultsmentioning
confidence: 99%