2010
DOI: 10.1063/1.3276159
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Optimal annealing conditions for Y1Ba2Cu3O7−δ thin films

Abstract: The superconducting current density, Jc, of Y1Ba2Cu3O7−δ (YBCO) is greatly influenced by hole doping levels. Hole doping is mainly dominated by oxygen ordering, so the postannealing process is one of the essential factors for practical applications of YBCO superconductors. However, little research has been reported about the variation in Jc by annealing time. In this study, the optimal annealing conditions were studied using homogeneous c-axis oriented YBCO thin films prepared by the pulsed laser deposition me… Show more

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Cited by 7 publications
(3 citation statements)
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“…It is well known that T c has a dome-like dependence on the hole concentration; that is, T c decreases in the case of overdoping. On the other hand, I c continues to increase even in overdoped REBCO film [25,26]. Therefore, it is not easy to infer the strain dependence of I c from that of T c .…”
Section: The Strain Dependence Of I C With Consideration Of Internal ...mentioning
confidence: 99%
“…It is well known that T c has a dome-like dependence on the hole concentration; that is, T c decreases in the case of overdoping. On the other hand, I c continues to increase even in overdoped REBCO film [25,26]. Therefore, it is not easy to infer the strain dependence of I c from that of T c .…”
Section: The Strain Dependence Of I C With Consideration Of Internal ...mentioning
confidence: 99%
“…We use annealing as a tool to systematically and selectively mobilize the smaller defects [18], which diffuse faster than larger ones. Annealing effects in YBCO have been extensively studied [19][20][21][22][23]. Recovery of the lattice by defect annihilation occurs if these defects can recombine within an [2]).…”
Section: Introductionmentioning
confidence: 99%
“…Annealing effects in YBCO have been extensively studied. [19][20][21][22][23] Recovery of the lattice by defect annihilation occurs if these defects can recombine within an effective diffusion range 𝑋 = 𝐷 𝑇 𝑡 ! , where D(T) is the temperature--dependent diffusion constant and ta the annealing time.…”
mentioning
confidence: 99%