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2013
DOI: 10.1166/jctn.2013.2754
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Optical Processes in Nanostructured Semiconductors

Abstract: We present a possibility to model morphology of surfaces of nanostructured semiconductor films by use of methods of nonlinear physics. We also describe experimental photoluminescence and absorption spectra in nanostructured fractal medium. By use of our theory we describe the new experimental fact of light localization in non-crystalline films. We suggest a fractal model for energy spectra of excitons in nanostructured semiconductors with porous structure. We obtain equations for exciton and multi-exciton ener… Show more

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Cited by 2 publications
(2 citation statements)
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“…Neural oscillations in certain ranges of parameters can be considered as chaotic processes with scaling regularities. Such processes can be classified by the following values of γ : γ 1 = 0.567, 1 − γ 1 ; γ 2 = 0.806, 1 − γ 2 ; γ 3 = 0.618, 1 − γ 3 [9,10].…”
Section: Models Of Neural Network Elements and Algorithms For Their Circuit Realizationsmentioning
confidence: 99%
“…Neural oscillations in certain ranges of parameters can be considered as chaotic processes with scaling regularities. Such processes can be classified by the following values of γ : γ 1 = 0.567, 1 − γ 1 ; γ 2 = 0.806, 1 − γ 2 ; γ 3 = 0.618, 1 − γ 3 [9,10].…”
Section: Models Of Neural Network Elements and Algorithms For Their Circuit Realizationsmentioning
confidence: 99%
“…Image Processing and Earth Remote Sensing Z Zh Zhanabaev, T Yu Grevtseva, K A Gonchar, G K Mussabek, D Yermukhamed, A A Serikbayev, R B Assilbayeva, A Zh Turmukhambetov and V Yu Timoshenko Nanocluster semiconductor films, including porous layers of silicon nanowire (SiNWs) grown in non-equilibrium conditions have scale-invariant, hierarchically self-similar, i.e. fractal and multifractal structure [10][11][12][13]. The scale invariance of a SiNW film is in their self-similarity (similarity coefficients on different variables are equal to each other) and self-affinity (similarity coefficients are different on different variables, that corresponds to anisotropic structure of the film).…”
Section: Introductionmentioning
confidence: 99%