Optical microscope with SNOM option for micro- and nanoanalytical investigations at low temperatures

Danzebrink, Hans‐Ulrich; Казанцев, Д. В.; Savio, Claudio Dal; Pierz, K.; Güttler, Bernd

doi:10.1007/s00339-002-1970-y

Cited by 11 publications

(6 citation statements)

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“…Figure 4 shows a scanned image of InAs quantum dots (QDs) grown on a semi-insulating GaAs wafer. Details regarding fabrication of the sample are published elsewhere [14]. The image presented in figure 4 represents contours of constant f (in this case f = 15 Hz ± 0.4) which may be interpreted as topography [15].…”

Section: Resultsmentioning

confidence: 99%

Development of a scanning probe microscope compact sensor head featuring a diamond probe mounted on a quartz tuning fork

Tyrrell

Sokolov

Danzebrink³

2003

Meas. Sci. Technol.

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The development of a compact scanning probe microscope sensor head, designed to mount around a standard microscope objective, is described. The instrument features a quartz tuning fork with an innovative diamond probe. This configuration has a number of key advantages: (i) the displacement of the probe relative to the sample surface is self-sensing, (ii) the diamond tip is robust and (iii) it is designed to accommodate future near-field optical applications. A custom current-to-voltage amplification circuit was conceived to compensate for the inherent capacitance of the quartz tuning fork. A mechanical design has been realized to allow positioning of the probe relative to the microscope objective and the swift exchange of quartz tuning fork sensors. Additionally, the design permits rotation of the sensor so that its orientation with respect to the sample may be changed. To demonstrate the feasibility and resolution of the system, a semi-insulating GaAs wafer has been imaged to reveal the presence of InAs quantum dots (QDs). The QDs can be seen clearly in the image presented here, with their height profiled to be typically 6 nm. Cross-sectional analysis of the raw data gives a background RMS value of 0.6 nm for a profile 2 µm in length.

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Section: Resultsmentioning

confidence: 99%

Development of a scanning probe microscope compact sensor head featuring a diamond probe mounted on a quartz tuning fork

Tyrrell

Sokolov

Danzebrink³

2003

Meas. Sci. Technol.

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“…We placed the described device in the vacuum chamber of the cryostat of the low-temperature SNOM [20] in order to minimize the signal-cable lengths. In several months of operation in these conditions, there were no failures (AD829JNs in standard plastic DIP cases were used).…”

Section: Drawbacks Of the Devicementioning

confidence: 99%

A Signal Preamplifier of the Piezoelectric Vibration Transducer of the Cantilever of an Atomic-Force Microscope

Казанцев

2005

Instrum Exp Tech

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An electronic circuit for amplitude and phase measurements of the forced vibrations of the tip of the scanning atomic-force microscope by the current flowing through the piezoelectric cell exciting these vibrations is described. The circuit allows the electronic correction of the Q factor (width of the resonance peak) of the driven oscillatory system tip-piezoelectric cell (for example, a crystal tuning fork), and, as a result, reduction by a factor of 2-50 of the settling time of the parameters of tip vibrations reflecting its interaction with the studied surface. The output signal of the described circuit corresponds to the current through the piezoelectric cell. Due to the proposed correction of the capacitive component of the piezoelectric cell's current, the phase range of the output signal observed upon attainment of the tuning-fork resonance frequency has increased from several degrees to a 180° theoretically expected value.

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Section: Sensor Objective With Beam Deflection Detectionmentioning

confidence: 99%

“…0.28 nm) have been resolved with this measuring setup despite the relatively large measuring circle (sample, microscope body, granite stand, positioning stages -cf. Figure 1.2) [13]. These measurements were performed in a dynamic SFM mode using conventional silicon cantilever probes.…”

Section: Sensor Objective With Beam Deflection Detectionmentioning

confidence: 99%

“…When optionally operated as optical near-field microscope, the same optics can be used for coupling and/or for collecting optical radiation into or from the near-field probe[12]. This allows very local optical investigations and spectroscopic surface characterizations to be performed even on submicroscopic structures[13].In topography mode (SFM mode), even single atomic terraces of a GaAs substrate wafer (step height: approx. 0.28 nm) have been resolved with this measuring setup despite the relatively large measuring circle (sample, microscope body, granite stand, positioning stages -cf.…”

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confidence: 99%

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Metrological Scanning Probe Microscopes ‐ Instruments for Dimensional Nanometrology

Danzebrink¹,

Pohlenz²,

Dai³

et al. 2005

Nanoscale Calibration Standards and Methods

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Optical microscope with SNOM option for micro- and nanoanalytical investigations at low temperatures

Cited by 11 publications

References 0 publications

Development of a scanning probe microscope compact sensor head featuring a diamond probe mounted on a quartz tuning fork

Development of a scanning probe microscope compact sensor head featuring a diamond probe mounted on a quartz tuning fork

A Signal Preamplifier of the Piezoelectric Vibration Transducer of the Cantilever of an Atomic-Force Microscope

Metrological Scanning Probe Microscopes ‐ Instruments for Dimensional Nanometrology

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