2006
DOI: 10.1063/1.2203513
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Optical knife-edge technique for nanomechanical displacement detection

Abstract: Articles you may be interested inNovel design and sensitivity analysis of displacement measurement system utilizing knife edge diffraction for nanopositioning stages Rev. Sci. Instrum. 85, 095113 (2014);

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Cited by 58 publications
(44 citation statements)
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“…Existing techniques widely used in MEMS (microelectromechanical systems) are being pursued with other NEMS resonators; among these are electrostatic 11,12 and piezoelectric 13 schemes for excitation and optical 11 and capacitive 12 schemes for detection. The efficiency of these schemes generally decreases substantially as we scale devices from the size regime of MEMS to that of NEMS.…”
mentioning
confidence: 99%
“…Existing techniques widely used in MEMS (microelectromechanical systems) are being pursued with other NEMS resonators; among these are electrostatic 11,12 and piezoelectric 13 schemes for excitation and optical 11 and capacitive 12 schemes for detection. The efficiency of these schemes generally decreases substantially as we scale devices from the size regime of MEMS to that of NEMS.…”
mentioning
confidence: 99%
“…In comparison, R 0 values in the range of 0.2 m −1 were reported recently for an optical technique applicable for in-plane vibration detection, 6 and 0.01 m −1 for an optical technique applicable for out-ofplane vibration detection. 7 Note that influences of beam bending were disregarded in the analysis of the responsivity.…”
Section: -mentioning
confidence: 99%
“…5 Optical motion detection techniques have the inherent advantage that optical signals can be communicated with very large bandwidth. [6][7][8] Unfortunately, for conventional optical techniques, diffraction effects limit the attainable detection limits when the mechanical devices are scaled. It has been anticipated that these issues can be overcome by integration of mechanical sensors with nanophotonics and by exploiting optical near-field effects.…”
mentioning
confidence: 99%
“…Most of the algorithms are based on the GerchbergSaxton method that iteratively relates two irradiance maps obtained at the plane of interest and also in the far field region. [11][12][13] In the MEMS arena, optical methods are routinely used as the displacement detection mechanism, [14][15][16] with the atomic force microscope probably the simplest and most well-known of these because it is based on the deflection of a light beam reflected by the cantilever itself. 17 The analysis of the stationary status of cantilevers using diffraction has been used previously to understand the individual position of each cantilever.…”
Section: Introductionmentioning
confidence: 99%