Nanocomposite materials represent a success story of nanotechnology. However,
development of nanomaterial fabrication still suffers from the lack of adequate
analysis tools. In particular, achieving and maintaining well-dispersed particle
distributions is a key challenge, both in material development and industrial
production. Conventional methods like optical or electron microscopy need laborious,
costly sample preparation and do not permit fast extraction of nanoscale structural
information from statistically relevant sample volumes. Here we show that optical
coherence tomography (OCT) represents a versatile tool for nanomaterial
characterization, both in a laboratory and in a production environment. The
technique does not require sample preparation and is applicable to a wide range of
solid and liquid material systems. Large particle agglomerates can be directly found
by OCT imaging, whereas dispersed nanoparticles are detected by model-based analysis
of depth-dependent backscattering. Using a model system of polystyrene
nanoparticles, we demonstrate nanoparticle sizing with high accuracy. We further
prove the viability of the approach by characterizing highly relevant material
systems based on nanoclays or carbon nanotubes. The technique is perfectly suited
for in-line metrology in a production environment, which is demonstrated using a
state-of-the-art compounding extruder. These experiments represent the first
demonstration of multiscale nanomaterial characterization using OCT.