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2005
DOI: 10.1016/j.jpcs.2005.09.059
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Optical characterization of InGaAsN/GaAsN/GaAs quantum wells with InGaP cladding layers

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Cited by 2 publications
(2 citation statements)
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“…1. The resolved spectral features have been verified simultaneously by photoluminescence, reflectance and transmittance spectroscopies [11]. The strong internal electric field induced Franz-Keldysh oscillation (FKO) features above the band gap energy of GaAs are omitted for clear viewing of the quantum well transitions.…”
Section: Resultsmentioning
confidence: 96%
“…1. The resolved spectral features have been verified simultaneously by photoluminescence, reflectance and transmittance spectroscopies [11]. The strong internal electric field induced Franz-Keldysh oscillation (FKO) features above the band gap energy of GaAs are omitted for clear viewing of the quantum well transitions.…”
Section: Resultsmentioning
confidence: 96%
“…[2][3][4] Previous research studies have reported the deterioration of the optical property and surface roughness in InGaAsN QWs grown after the Al-contained alloy in molecular beam epitaxy (MBE) 4) and metal-organic chemical vapor deposition (MOCVD) 2,3) systems. A few methods, such as those involving the use of an Al-free MBE system 5) and InGaP cladding layers, 6) and two-step growth, 7) have been proposed to solve this problem. However, the Al-free structure makes the fabrication of VCSELs very difficult, and two-step growth is time consuming.…”
mentioning
confidence: 99%