2017
DOI: 10.1016/j.optlaseng.2016.08.007
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Optical characterization of high speed microscanners based on static slit profiling method

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Cited by 3 publications
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“…The values of the laser beam width measured by the single slit method are accurate. Alaa Elhady A [19] presented a simple method to characterize beam spot profile, the setup is similar to the sketch shown in Fig. 1(b).…”
Section: Introductionmentioning
confidence: 99%
“…The values of the laser beam width measured by the single slit method are accurate. Alaa Elhady A [19] presented a simple method to characterize beam spot profile, the setup is similar to the sketch shown in Fig. 1(b).…”
Section: Introductionmentioning
confidence: 99%