Optical beam induced currents in MOS transistors

Fritz, J.; Lackmann, R.

doi:10.1016/0167-9317(90)90051-t

Cited by 10 publications

(4 citation statements)

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“…In the same way as light emission, the techniques based on laser stimulation have been mainly developed in failure analysis [8] [9]. On the one hand, the laser stimulation at a 1064 nm wavelength allows to induce a local photocurrent [10], either to detect a latch-up mechanism and inter-level shorts or to locate open circuits and direct semiconductor damage (LIVA, OBIC). On the other hand, the laser stimulation at a 1340 nm wavelength can also induce a thermal variation to detect a resistance variation by measuring the power consumption across a circuit (TIVA, OBIRCH).…”

Section: Introductionmentioning

confidence: 99%

“…The photoelectric laser stimulation is a failure analysis technique that uses a scanning laser beam to induce a current flow. This one can be collected and analyzed to generate images that represent the semiconductor sample properties [10]. Indeed, when the laser beam scans the surface of the sample, some electrons into the conduction band are excited thanks to the 'single-photon absorption' phenomenon.…”

Section: Introductionmentioning

confidence: 99%

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Cryptographic Hardware and Embedded Systems, CHES 2010

Mangard¹,

Standaert²

2010

Lecture Notes in Computer Science

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The purpose of failure analysis is to locate the source of a defect in order to characterize it, using different techniques (laser stimulation, light emission, electromagnetic emission...). Moreover, the aim of vulnerability analysis, and particularly side-channel analysis, is to observe and collect various leakages information of an integrated circuit (power consumption, electromagnetic emission ...) in order to extract sensitive data. Although these two activities appear to be distincted, they have in common the observation and extraction of information about a circuit behavior. The purpose of this paper is to explain how and why these activities should be combined. Firstly it is shown that the leakage due to the light emitted during normal operation of a CMOS circuit can be used to set up an attack based on the DPA/DEMA technique. Then a second method based on laser stimulation is presented, improving the "traditional" attacks by injecting a photocurrent, which results in a punctual increase of the power consumption of a circuit. These techniques are demonstrated on an FPGA device.

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Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Cryptographic Hardware and Embedded Systems, CHES 2010

Mangard¹,

Standaert²

2010

Lecture Notes in Computer Science

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show abstract

“…This one can be collected and analyzed to generate images that represent the semiconductor sample properties [10]. Indeed, when the laser beam scans the surface of the sample, some electrons into the conduction band are excited thanks to the 'single-photon absorption' phenomenon.…”

Section: Introductionmentioning

confidence: 99%

“…On the one hand, the laser stimulation at a 1064 nm wavelength allows to induce a local photocurrent [10], either to detect a latch-up mechanism and inter-level shorts or to locate open circuits and direct semiconductor damage (LIVA, OBIC). On the other hand, the laser stimulation at a 1340 nm wavelength can also induce a thermal variation to detect a resistance variation by measuring the power consumption across a circuit (TIVA, OBIRCH).…”

Section: Introductionmentioning

confidence: 99%

When Failure Analysis Meets Side-Channel Attacks

Di-Battista

Courrège

Rouzeyre

et al. 2010

Lecture Notes in Computer Science

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Abstract. The purpose of failure analysis is to locate the source of a defect in order to characterize it, using different techniques (laser stimulation, light emission, electromagnetic emission...). Moreover, the aim of vulnerability analysis, and particularly side-channel analysis, is to observe and collect various leakages information of an integrated circuit (power consumption, electromagnetic emission ...) in order to extract sensitive data. Although these two activities appear to be distincted, they have in common the observation and extraction of information about a circuit behavior. The purpose of this paper is to explain how and why these activities should be combined. Firstly it is shown that the leakage due to the light emitted during normal operation of a CMOS circuit can be used to set up an attack based on the DPA/DEMA technique. Then a second method based on laser stimulation is presented, improving the "traditional" attacks by injecting a photocurrent, which results in a punctual increase of the power consumption of a circuit. These techniques are demonstrated on an FPGA device.

show abstract