Optical-Beam-Induced-Current Analysis of Wear-Out Degradation in High-Reliability Fabry–Perot Laser Diodes for Access Networks

Ito, Tsuyoshi; Takeshita, Toru; Sugo, Mitsuru; Kurosaki, T.; Akatsu, Y.; Kato, Kazutoshi

doi:10.1143/jjap.47.4523

Cited by 3 publications

(1 citation statement)

References 13 publications

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“…On the other hand, for light at wavelengths of 1.06, 0.97, and 0.94 mm, the relative OBIC intensity is less than 1.0 and there is degradation in the active and SCH layers [30,31]. The results for the two types of light indicate the degradation in the SCH layer, which means that some defects diffuse from the SCH layer to the active layer.…”

Section: Sch Layer Degradationmentioning

confidence: 92%

Failure Analysis Using Optical Evaluation Technique (OBIC) of LDs and APDs for Fiber Optical Communication

Takeshita

2012

Materials and Reliability Handbook for Semiconductor Optical and Electron Devices

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By employing the optical-beam-induced current (OBIC) measurement technique, we have analyzed the sudden and wear-out failure of optical devices. The extent of the degraded region is estimated by using relative OBIC intensity prior to aging. The use of OBIC incident sources at several wavelengths enables us to detect degradation in facets, epitaxial layers, and the device interior. IntroductionOptical-beam-induced current (OBIC) measurement [1][2][3][4], as well as other approaches such as electron-beam-induced current (EBIC) measurement [5] and luminescence measurement [6], can determine the existence of deterioration in optical and electronic devices. Of these approaches, the OBIC technique has the advantages of being nondestructive and capable of selecting wavelengths [7].First, since the OBIC is measured through the window of a transistor outline (TO) can before and after aging, we are able to detect an OBIC change for several periods of aging. When there are nonradiative recombination centers in the degraded region, the OBIC intensity decreases as the recombination density increases [8]. The relative OBIC intensity prior to aging is useful for analyzing the degree of device degradation. Furthermore, the incident light that illuminates the facet is absorbed in the semiconductor. However, the lights incident on the top surface rather than the facet are absorbed in the layer to a depth of not more than a few micrometer. The OBIC measurement technique that involves illuminating the facet is therefore expected to be highly susceptible to degradation.

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Section: Sch Layer Degradationmentioning

confidence: 92%

Failure Analysis Using Optical Evaluation Technique (OBIC) of LDs and APDs for Fiber Optical Communication

Takeshita

2012

Materials and Reliability Handbook for Semiconductor Optical and Electron Devices

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Degradation Analysis of InP Buried Heterostructure Layers in Lasers Using Optical-Beam-Induced-Current Technique

Takeshita

Sato

Mitsuhara

et al. 2010

IEEE Trans. Device Mater. Relib.

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Failure Analysis Using Optical Evaluation Technique (OBIC) of LDs for Fiber Optical Communication

Takeshita

Oohashi

2009

MRS Proc.

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The introduction of high-speed services for fiber-optic access subscribers has led to a huge growth in data traffic. The rapid diversification of services means that next generation networks must be built quickly, economically and reliably.A high temperature laser allows us to eliminate the thermo-electric cooler conventionally needed in a transmitter module, which results in reductions in cost, power consumption and size. Moreover, a high-power laser provides a wide tolerance when coupling optical fibers. In addition, a high-power pump laser is needed to realize a wide-band and high-power erbium-doped fiber amplifier. This makes high-performance laser chips one of the keys to achieving highly reliable and cost-effective systems.In terms of laser reliability, we must clarify the degradation mechanism and postpone or suppress degradation if we are to achieve a reliable high-performance laser. We have analyzed degraded lasers using the optical beam induced current (OBIC) technique. When there are nonradiative recombination centers in the degraded region, the OBIC intensity decreases with increases in recombination density. This technique has the advantages of being non-destructive and highly sensitive. In addition, it provides high space resolution in degradation analyses.The OBIC is measured through the window of a transistor outline (TO) can before and after aging. Then, by using the same LDs we can detect an OBIC change for several aging times. We can both detect the degraded region and layer, and estimate the degree of laser degradation by employing the relative OBIC intensity prior to aging. This OBIC technique is useful for analyzing the degree of laser degradation.Moreover, the incident wavelength can be changed by changing the optical source in the OBIC measurement setup, which in turn changes the absorption layer and the penetration distance. Some degraded laser layers are reveled by using these several wavelengths absorbed in different layers. In addition, degradation in the waveguide interior is detected by using an incident wavelength with long penetration. Thus, by monitoring the OBIC intensity at several wavelengths as well as before and after aging, we are able to discuss sudden and wear-out laser failures. In our presentation, we will introduce examples using the OBIC technique that contributed to the improvement of laser reliability.

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Optical-Beam-Induced-Current Analysis of Wear-Out Degradation in High-Reliability Fabry–Perot Laser Diodes for Access Networks

Cited by 3 publications

References 13 publications

Failure Analysis Using Optical Evaluation Technique (OBIC) of LDs and APDs for Fiber Optical Communication

Failure Analysis Using Optical Evaluation Technique (OBIC) of LDs and APDs for Fiber Optical Communication

Degradation Analysis of InP Buried Heterostructure Layers in Lasers Using Optical-Beam-Induced-Current Technique

Failure Analysis Using Optical Evaluation Technique (OBIC) of LDs for Fiber Optical Communication

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