2010 East-West Design &Amp; Test Symposium (EWDTS) 2010
DOI: 10.1109/ewdts.2010.5742113
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On-chip measurements of standard-cell propagation delay

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“…Due to the continuous advances in very large scale integration circuit technology and the corresponding growth in system complexity, digital designers often rely on a semi-custom design flow, exploiting standard-cell libraries [1][2]. By means of a standard-cell design flow, silicon area can be effectively exploited while keeping costs and development time under control [3][4]. The application-specific integrated circuit (ASIC) design approach depends highly on library quality to meet the design specifications [5].…”
Section: Introductionmentioning
confidence: 99%
“…Due to the continuous advances in very large scale integration circuit technology and the corresponding growth in system complexity, digital designers often rely on a semi-custom design flow, exploiting standard-cell libraries [1][2]. By means of a standard-cell design flow, silicon area can be effectively exploited while keeping costs and development time under control [3][4]. The application-specific integrated circuit (ASIC) design approach depends highly on library quality to meet the design specifications [5].…”
Section: Introductionmentioning
confidence: 99%