2016
DOI: 10.1109/jphot.2016.2524208
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Ohmic Contacts With Ultra-Low Optical Loss on Heavily Doped n-Type InGaAs and InGaAsP for InP-Based Photonic Membranes

Abstract: In this paper, we present significant reductions of optical losses and contact resistances in AgGe-based ohmic contacts to InP membranes. Due to the high solubility of Si in InGaAs and InGaAsP, heavily doped n-type contact layers are grown on InP wafers. This high doping concentration gives rise to annealing-free ohmic contacts and low contact resistances at the level of 10 À7 cm 2 . It also leads to strong band-filling effects in InGaAs and InGaAsP, which result in low optical absorption losses in the contact… Show more

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Cited by 7 publications
(10 citation statements)
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References 24 publications
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“…Recently Shen et al [9] used the bandfilling effect to explain the low-optical-loss in highly-doped n-InGaAs contact layers. In [9] a model by Weber [10] is used to predict the electron-concentration-dependent absorption in n-InGaAs and includes three free-carrier induced effects: bandfilling, bandgap shrinkage and free carrier absorption.…”
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confidence: 99%
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“…Recently Shen et al [9] used the bandfilling effect to explain the low-optical-loss in highly-doped n-InGaAs contact layers. In [9] a model by Weber [10] is used to predict the electron-concentration-dependent absorption in n-InGaAs and includes three free-carrier induced effects: bandfilling, bandgap shrinkage and free carrier absorption.…”
mentioning
confidence: 99%
“…In [9] a model by Weber [10] is used to predict the electron-concentration-dependent absorption in n-InGaAs and includes three free-carrier induced effects: bandfilling, bandgap shrinkage and free carrier absorption. The Urbach tail was neglected.…”
mentioning
confidence: 99%
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