2014
DOI: 10.1016/j.sab.2014.06.025
|View full text |Cite
|
Sign up to set email alerts
|

Observation of X-ray shadings in synchrotron radiation-total reflection X-ray fluorescence using a color X-ray camera

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

0
17
0

Year Published

2014
2014
2023
2023

Publication Types

Select...
6

Relationship

1
5

Authors

Journals

citations
Cited by 15 publications
(17 citation statements)
references
References 10 publications
0
17
0
Order By: Relevance
“…The unique properties of SLcam r make it ideal for, e.g. TXRF applications where detailed information on X-ray beam propagation and shadowing effects can be measured [16] and analyzed with appropriate models [18] . The first successful installation of SLcam r at PIXE facility was recently realized at High-Speed PIXE beamline at Ion Beam Center at Helmholtz-Zentrum Dresden-Rossendorf.…”
Section: Discussionmentioning
confidence: 99%
See 2 more Smart Citations
“…The unique properties of SLcam r make it ideal for, e.g. TXRF applications where detailed information on X-ray beam propagation and shadowing effects can be measured [16] and analyzed with appropriate models [18] . The first successful installation of SLcam r at PIXE facility was recently realized at High-Speed PIXE beamline at Ion Beam Center at Helmholtz-Zentrum Dresden-Rossendorf.…”
Section: Discussionmentioning
confidence: 99%
“…The first sample (see Figure 4) is a picoliter droplet of Ni solution [16] . The droplet was measured at synchrotron facility in TXRF geometry and with 8:1 magnifying optics.…”
Section: Real Samplesmentioning
confidence: 99%
See 1 more Smart Citation
“…A study of a fundamental topic was presented by Fittschen et al 64 who addressed the problem of absorption effects and the impact of specimen shape on TXRF analysis. Model calculations indicated that a ring-shaped specimen should give better results in terms of higher counts per mass, compared with a lled rectangle or circle shaped samples.…”
Section: Txrf and Related Techniquesmentioning
confidence: 99%
“…A correct interpretation of the angular profiles of intermediate structures is of prime importance, in particular for investigation of nanostructures and for TXRF measurements of droplets where the quantification problem is one of the main issues [45].…”
Section: Motivation and Basic Principlesmentioning
confidence: 99%