Grazing angle X-ray fluorescence from periodic structures on silicon and silica surfaces

Nowak, S.; Banaś, D.; Błchucki, W.; Cao, Wei; Dousse, J.‐Cl.; Hönicke, Philipp; Hoszowska, J.; Jabłoński, Ł.; Kayser, Yves; Kubala‐Kukuś, A.; Pajek, M.; Reinhardt, Falk; Savu, Andreea Veronica; Szlachetko, Jakub

doi:10.1016/j.sab.2014.03.015

Cited by 20 publications

(19 citation statements)

References 51 publications

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“…The thin slab applied in the simulation allows more light transmissions above the Si absorption threshold energy, leading to lower backward reflection (Nowak et al 2014). As for the coated surfaces, it is noticed a large absorption below 400 nm happens on the NOA 63 photopolymer surface, but not so on the SiO2 one in the simulation model.…”

Section: Morphologymentioning

confidence: 93%

Leaf-structure patterning for antireflective and self-cleaning surfaces on Si-based solar cells

et al. 2018

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As the naturally evolved sunlight harvester, plant foliage is gifted with dedicated air-leaf interfaces countering light reflections and ambient ruins, yet offering antireflective and selfcleaning prototypes for manmade photovoltaics. In this work, we report on an ecological and bioinspired coating strategy by replicating leaf structures onto Si-based solar cells. Transparent photopolymer with leaf surface morphologies was tightly cured on Si slabs through a facile double transfer process. After bio-mimicked layer coverages, sunlight reflection drops substantially from more than 35% down to less than 20% once lotus leaf was employed as the master. Consequentially, 10.9% gain of the maximum powers of the photovoltaic is obtained. The leaf replicas inherited their masters' hydrophobicity which is resistant to acidic and basic conditions. Physically adhered dusts are easily removed by water rolling. Lightwave guidance mechanism among air-polymer-Si interfaces is explicated through optical simulations, while wettability through the morphological impacts on hydrophobic states. Taking advantages of varieties of foliage species and surface structures, the work is hoped to boost large-scale industrial designs and realizations of the bionic antireflective and superhydrophobic coating on future solar cells.

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Section: Morphologymentioning

confidence: 93%

Leaf-structure patterning for antireflective and self-cleaning surfaces on Si-based solar cells

et al. 2018

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“…Interference fringes can also be observed for articial nanostructures on the top of a substrate in the GEXRF and GIXRF intensity proles. [60][61][62] Note, that for the considered ion-implanted samples no interference fringes will show up in the angular intensity proles since there is only one refraction interface for the incident, respectively emitted X-rays (the sample surface itself) and since the XRF signal originates from below the refracting interface. A further experimental difference between GIXRF and GEXRF is given by a different sensitivity of the sample matrix to the respective Xray energy of interest, the difference being pronounced by the long emission, respectively incidence paths.…”

Section: Introductionmentioning

confidence: 99%

Depth profiling of low energy ion implantations in Si and Ge by means of micro-focused grazing emission X-ray fluorescence and grazing incidence X-ray fluorescence

Kayser

Hönicke

Banaś

et al. 2015

J. Anal. At. Spectrom.

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Depth-profiling measurements by means of synchrotron radiation based grazing XRF techniques, i.e., grazing emission X-ray fluorescence (GEXRF) and grazing incidence X-ray fluorescence (GIXRF), present a promising approach for the non-destructive, sub-nanometer scale precision characterization of ultra shallow ion-implantations. The nanometer resolution is of importance with respect to actual semiconductor applications where the down-scaling of the device dimensions requires the doping of shallower depth ranges. The depth distributions of implanted ions can be deduced from the intensity dependence of the detected X-ray fluorescence (XRF) signal from the dopant atoms on either the grazing emission angle of the emitted X-rays (GEXRF), or the grazing incidence angle of the incident Xrays (GIXRF). The investigated sample depth depends on the grazing angle and can be varied from a few to several hundred nanometers. The GEXRF setup was equipped with a focusing polycapillary half-lens to allow for laterally resolved studies. The dopant depth distribution of the investigated low-energy (energy range from 1 keV up to 8 keV) P, In and Sb ion-implantations in Si or Ge wafers were reconstructed from the GEXRF data by using two different approaches, one with and one without a priori knowledge about the bell-shaped dopant depth distribution function. The results were compared to simulations and the trends predicted by theory were found to be well reproduced. The experimental GEXRF findings were moreover verified for selected samples by GIXRF.

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“…Combining GIXRF with near edge X-ray absorption fine structure (NEXAFS) measurements on a sample containing a Ti/Ti 2 O 3 layer provided besides depth information also information on the binding status of titanium. [111][112][113][114][115][116][117][118][119][120].…”

Section: Surface and Thin-layer Analysismentioning

confidence: 99%

Total reflection X-ray fluorescence

Schmeling

2019

Physical Sciences Reviews

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Abstract Total reflection X-ray fluorescence (TXRF) spectrometry is a non-destructive and surface sensitive multi-element analytical method based on energy dispersive X-ray fluorescence spectrometry with detection limits in the lower picogram range. It utilizes the total reflection of the primary X-ray beam at or below the critical angle of incidence. At this angle, the fluorescence intensity is substantially enhanced for samples present as small granular residue or as thin homogenous layer deposited at the surface of a thick substrate. Generally, two types of application exist: micro- and trace-analysis as well as surface and thin-layer analysis. For micro- and trace-analysis, a small amount of the solid or liquid sample is deposited on an optically flat substrate, typically quartz or polycarbonate. The dried residue is analyzed at a fixed angle setting slightly below the critical angle. Quantification is carried out by means of internal standardization. For surface and thin-layer analysis, the surface of an optically flat substrate is scanned. Variations of the incident angle of the primary X-ray beam provide information about the type and sometimes also the amount of material present at or slightly below the surface of the substrate. Major fields of application are environmental samples, biological tissues, objects of cultural heritage, semiconductors and thin-layered materials and films.

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Grazing angle X-ray fluorescence from periodic structures on silicon and silica surfaces

Cited by 20 publications

References 51 publications

Leaf-structure patterning for antireflective and self-cleaning surfaces on Si-based solar cells

Leaf-structure patterning for antireflective and self-cleaning surfaces on Si-based solar cells

Depth profiling of low energy ion implantations in Si and Ge by means of micro-focused grazing emission X-ray fluorescence and grazing incidence X-ray fluorescence

Total reflection X-ray fluorescence

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