2010
DOI: 10.3390/s100201012
|View full text |Cite
|
Sign up to set email alerts
|

Observation and Measurement of Negative Differential Resistance on PtSi Schottky Junctions on Porous Silicon

Abstract: Nanosize porous Si is made by two step controlled etching of Si. The first etching step is carried on the Si surface and the second is performed after deposition of 75 Å of platinum on the formed surface. A platinum silicide structure with a size of less than 25 nm is formed on the porous Si surface, as measured with an Atomic Forced Microscope (AFM). Differential resistance curve as a function of voltage in 77 K and 100 K shows a negative differential resistance and indicates the effect of quantum tunneling. … Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1
1

Citation Types

1
4
0

Year Published

2012
2012
2018
2018

Publication Types

Select...
4
4

Relationship

1
7

Authors

Journals

citations
Cited by 13 publications
(5 citation statements)
references
References 15 publications
1
4
0
Order By: Relevance
“…The metal alloys like Au-In, In-Sn, and so on showed rectifying behavior (Angelescu and Kleps 1998). The alloyed PtSi/porous Si contact shows a good ohmic characteristic with a low contact resistance (Ichinohe et al 1996) but the PtSi/PSi/PtSi structure produces a nonlinear relation for carrier transport as confirmed Downloaded by [United Arab Emirates University ] at 03:54 27 June 2016 by I-V curve measurement (Banihashemian et al 2010). Au/porous Si contact shows the Schottky behavior with a high resistance, even under the forward bias.…”
Section: Ohmic and Rectifying Behavior Of M-psi Contactssupporting
confidence: 52%
“…The metal alloys like Au-In, In-Sn, and so on showed rectifying behavior (Angelescu and Kleps 1998). The alloyed PtSi/porous Si contact shows a good ohmic characteristic with a low contact resistance (Ichinohe et al 1996) but the PtSi/PSi/PtSi structure produces a nonlinear relation for carrier transport as confirmed Downloaded by [United Arab Emirates University ] at 03:54 27 June 2016 by I-V curve measurement (Banihashemian et al 2010). Au/porous Si contact shows the Schottky behavior with a high resistance, even under the forward bias.…”
Section: Ohmic and Rectifying Behavior Of M-psi Contactssupporting
confidence: 52%
“…AFM scans were taken at 512‐ × 512‐pixel resolution and produced topographic images of the samples in which the brightness of features increases as a function of height. Typical scanning parameters have been described elsewhere (Banihashemian et al,2010).…”
Section: Methodsmentioning
confidence: 99%
“…However, a few studies have performed electron transport mechanism in PtSi layer on a porosified substrate. According to the published results [1, 14], room temperature operability of PtSi/porous Si is because of the single‐electron tunnelling (SET) or Coulomb blockade effect that is concluded from small depletion capacitance of this Schottky barrier. The study of such effects opens ways for a better understanding of small‐scale physics and electronics and could possibly lead in viable low power and fast devices in high‐density circuits.…”
Section: Introductionmentioning
confidence: 99%