NVNA Techniques for Pulsed RF Measurements

A novel quadratic polynomial expansion of nonlinear scattering function for RF power amplifier modeling

“…Recently, high‐frequency nonlinear measurement systems have gained increasing market with the development of large signal network analyzers, like the Keysight nonlinear vector network analyzer (NVNA) and Rohde&Schwarz ZVA . Such instruments are typically capable of measuring both the amplitude and the phase of all significant harmonics of both input and output traveling waves of the active device under nonlinear operation.…”

“…[5][6][7] Recently, high-frequency nonlinear measurement systems have gained increasing market with the development of large signal network analyzers, like the Keysight nonlinear vector network analyzer (NVNA) and Rohde&Schwarz ZVA. [8][9][10]…”

High resolution wideband calibration procedure for RF time-domain measurement of non-linear devices

“…Customized measurements test benches like LSNA [5], [6] NVNA [7] have been developed to measure pulsed RF CW time-domain voltage and current waveforms at both ports of non-linear devices. These instruments measure only the CW signal and its associated harmonics within the pulse.…”

Synthesized pulsed bias for device characterization

“…Pulsed bias conditions are commonly employed [1], [2] in the characterization of semiconductor devices [3], [4], either to mimic isothermal operation [5], [6], [7], or to measure the device under test (DUT) in bias regimes, which are otherwise unobtainable (i.e., outside the safe device operating area). Typically, the hardware configuration, i.e., connecting cables, wafer probes, bias-tees, together with the loading provided by the DUT itself, determines the minimum duration of the pulses that can be effectively applied to the device, while retaining a reasonable shape of the waveform.…”