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2014
DOI: 10.5012/bkcs.2014.35.8.2415
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Normalized Contact Force to Minimize "Electrode-Lead" Resistance in a Nanodevice

Abstract: In this report, the contact resistance between "electrode" and "lead" is investigated for reasonable measurements of samples' resistance in a polypyrrole (PPy) nanowire device. The sample's resistance, including "electrode-lead" contact resistance, shows a decrease as force applied to the interface increases. Moreover, the sample's resistance becomes reasonably similar to, or lower than, values calculated by resistivity of PPy reported in previous studies. The decrease of electrode-lead contact resistance by i… Show more

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Cited by 3 publications
(1 citation statement)
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“…V-I measurements were carried out with minimal contact resistances. 35 Measurements of photocurrent gain were carried out by a light source using the halogen lamp with a blue-color bandpass filter (425-475 nm). The intensity of the light source was controlled by changing the lamp power, and photocurrent was measured immediately after the light irradiation.…”
Section: Opto-electrical Characteristicsmentioning
confidence: 99%
“…V-I measurements were carried out with minimal contact resistances. 35 Measurements of photocurrent gain were carried out by a light source using the halogen lamp with a blue-color bandpass filter (425-475 nm). The intensity of the light source was controlled by changing the lamp power, and photocurrent was measured immediately after the light irradiation.…”
Section: Opto-electrical Characteristicsmentioning
confidence: 99%