We review the current status of metallic photocathodes based on thin films prepared by pulsed laser deposition (PLD) and we explore ways to improve the performance of these devices. PLD seems to be a very efficient and suitable technique for producing adherent and uniform thin films. Time-resolved mass spectrometric investigations definitively suggest that the deposition of high-purity metallic thin films should be carried out in ultrahigh vacuum systems and after a deep and careful laser cleaning of the target surface. Moreover, the laser cleaning of the target surface is highly recommended not only to remove the first contaminated layers but also to improve the quality of the vacuum by reducing the partial pressure of reactive chemical species as H 2 O, H 2 , and O 2 molecules. The challenge to realize high-purity Mg and Y thin films is very interesting for the photocathode R&D due to the good photoemission properties of these metals. Photocathodes based on Mg and Y thin films have been characterized by scanning electron microscopy and x-ray diffraction techniques to derive the morphological and structural features, respectively. They were also tested in a photodiode cell to deduce the photoelectron properties. The quantum efficiency of such photocathodes was systematically improved by in situ laser cleaning treatments of the surface in order to remove the contaminated layers reaching, in this way, the quantum efficiency of the corresponding bulk materials.
Ultraviolet (UV) Excimer laser assisted processing is an alternative strategy for producing patterned silicon germanium heterostructures. We numerically analyzed the effects caused by pulsed 193 Excimer laser radiation impinging on patterned amorphous hydrogenated silicon (a-Si:H) and germanium (a-Ge:H) bilayers deposited on a crystalline silicon substrate [Si(100)]. The proposed two dimensional axisymmetric numerical model allowed us to estimate the temperature and concentration gradients caused by the laser induced rapid melting and solidification processes. Energy density dependence of maximum melting depth and melting time evolution as well as three dimensional temperature and element distribution have been simulated and compared with experimentally obtained results.
Pb thin films were prepared by the ns pulsed laser deposition technique on Si (100) and polycrystalline Nb substrates for photocathode application. As the photoemission performances of a cathode are strongly affected by its surface characteristics, the Pb films were grown at different substrate temperatures with the aim of modifying the morphology and structure of thin films. Atomic force microscopy and scanning electron microscopy analyses showed a strong morphological change in the deposited films with the substrate temperature, and the formation of spherical grains at higher temperatures with the nucleation of large voids on the film surface. X-ray diffraction measurements showed that a preferred orientation of Pb (111)
Pb thin films were deposited on Nb substrates by means of pulsed laser deposition (PLD) with UV radiation (248 nm), in two different ablation regimes: picosecond (5 ps) and subpicosecond (0.5 ps). Granular films with grain size on the micron scale have been obtained, with no evidence of large droplet formation. All films presented a polycrystalline character with preferential orientation along the (111) crystalline planes. A maximum quantum efficiency (QE) of 7:3 Â 10 À5 (at 266 nm and 7 ns pulse duration) was measured, after laser cleaning, demonstrating good photoemission performance for Pb thin films deposited by ultrashort PLD. Moreover, Pb thin film photocathodes have maintained their QE for days, providing excellent chemical stability and durability. These results suggest that Pb thin films deposited on Nb by ultrashort PLD are a noteworthy alternative for the fabrication of photocathodes for superconductive radio-frequency electron guns. Finally, a comparison with the characteristics of Pb films prepared by ns PLD is illustrated and discussed.
11Pb thin films were prepared at room temperature and in high vacuum by thermal 12 evaporation and pulsed laser deposition techniques. Films deposited by both the techniques 13 were investigated by scanning electron microscopy to determine their surface topology. The 14 structure of the films was studied by X-ray diffraction in θ-2θ geometry. The photoelectron 15 performances in terms of quantum efficiency were deduced by a high vacuum photodiode 16 cell before and after laser cleaning procedures. Relatively high quantum efficiency (>10 -5 )
In this work, the authors compare the morphological, structural, nanomechanical, and microtribological properties of Pb films deposited by thermal evaporation (TE) and pulsed laser deposition (PLD) techniques onto Si (111) substrates. Films were investigated by scanning electron microscopy, surface probe microscopy, and x-ray diffraction in θ-2θ geometry to determine their morphology, root-mean-square (RMS) roughness, and microstructure, respectively. TE films showed a percolated morphology with densely packed fibrous grains while PLD films had a granular morphology with a columnar and tightly packed structure in accordance with the zone growth model of Thornton. Moreover, PLD films presented a more polycrystalline structure with respect to TE films, with RMS roughness of 14 and 10 nm, respectively. Hardness and elastic modulus vary from 2.1 to 0.8 GPa and from 14 to 10 GPa for PLD and TE films, respectively. A reciprocal friction test has shown that PLD films have lower friction coefficient and wear rate than TE films. Our study has demonstrated for first time that, at the microscale, Pb films do not show the same simple lubricious properties measured at the macroscale.
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