2010 IEEE MTT-S International Microwave Symposium 2010
DOI: 10.1109/mwsym.2010.5515568
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Nonlinear characterization techniques for improving accuracy of GaN HEMT model predictions in RF power amplifiers

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Cited by 3 publications
(1 citation statement)
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“…The extraction was performed using a small signal and low frequency RF excitation at gate terminal, as in the classic procedure [2], but superimposed over a triangle‐shaped biasing signal, covering the range from below pinch‐off up to positive values near to the gate conduction level. In this dynamic type of characterization [4], the derivative profiles may be captured in a single sweep of a Vector Signal Analyzer (Agilent 89600), avoiding the appearance of self‐heating or trap‐related dispersion effects.…”
Section: Phemt‐based Down‐converting Topology With Vector Control mentioning
confidence: 99%
“…The extraction was performed using a small signal and low frequency RF excitation at gate terminal, as in the classic procedure [2], but superimposed over a triangle‐shaped biasing signal, covering the range from below pinch‐off up to positive values near to the gate conduction level. In this dynamic type of characterization [4], the derivative profiles may be captured in a single sweep of a Vector Signal Analyzer (Agilent 89600), avoiding the appearance of self‐heating or trap‐related dispersion effects.…”
Section: Phemt‐based Down‐converting Topology With Vector Control mentioning
confidence: 99%