2018
DOI: 10.1109/tim.2018.2830859
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Noncontact Wideband Current Probes With High Sensitivity and Spatial Resolution for Noise Location on PCB

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Cited by 38 publications
(18 citation statements)
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“…Its ultra-compact size, added to the all-dielectric composition, makes it suitable for applications where the distortion of the E-field is critical, in presence of intense fields or when EM-invisible or safe probe, non-inductive, are required. However, this probe is extremelly suitable when high spatial resolution and large bandwidth performances are required being interesting for applications in printed circuit board (PCB) industry where electric components tend to be more compact and the signals, higher in frequency 60 . The Fano fibered-sensor probe may go beyond the limits that the actual probes present.…”
Section: Resultsmentioning
confidence: 99%
“…Its ultra-compact size, added to the all-dielectric composition, makes it suitable for applications where the distortion of the E-field is critical, in presence of intense fields or when EM-invisible or safe probe, non-inductive, are required. However, this probe is extremelly suitable when high spatial resolution and large bandwidth performances are required being interesting for applications in printed circuit board (PCB) industry where electric components tend to be more compact and the signals, higher in frequency 60 . The Fano fibered-sensor probe may go beyond the limits that the actual probes present.…”
Section: Resultsmentioning
confidence: 99%
“…To the best of the Authors' knowledge, available electric near-field probes possibly suitable for EM susceptibility investigation can be grouped into two main categories: (a) PCB-based probes (see Fig. 1(a)) [5], [8]; and (b) semi-rigid coaxial cable probes (see Fig. 1(b)) [3], [13], [15], [16].…”
Section: Characteristics Of Immunity Tests and Injection Probesmentioning
confidence: 99%
“…Moreover, the obtained EM-field maps can be post-processed, e.g., reconstructed by equivalent surface dipoles, and then used as the interference source for numerical simulation of complex systems, [2]. To this end, the electric and/or magnetic field distribution above the circuit under test is measured by the use of near-field probes (e.g., semi-rigid coaxial cables or PCB-based probes [3]- [8]) assuring high sensitivity to local EM field components and spatial resolution. These characteristics make these probes attractive also as injection devices for immunity testing.…”
Section: Introductionmentioning
confidence: 99%
“…Therefore, the simulations in full-wave tools lack sufficient conditions. The research on the source reconstruction has become more attractive [1].…”
Section: Introductionmentioning
confidence: 99%