New Reprogrammable and Non-Volatile Radiation Tolerant FPGA: RTA3P

Rezgui, S.; Wang, J.J.; Sun, Yinming; Cronquist, B.; McCollum, J.

doi:10.1109/aero.2008.4526472

Cited by 24 publications

(8 citation statements)

References 6 publications

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“…Previous work of accurate SET pulse electrical injection shows a strong SET pulse-width modulation when SET pulse traverses logic gates [8]. In addition, it has been concluded that the SET pulse width at the input of the storage element is strictly dependent on the propagation and type of traversed logic gates [9].…”

Section: Related Workmentioning

confidence: 94%

“…In addition, it has been concluded that the SET pulse width at the input of the storage element is strictly dependent on the propagation and type of traversed logic gates [9]. This SET pulse width is also dependent on the routing structure of the used technology [8]. In [10], an Accurate Analysis of SET effects on Flash-based FPGA System-on-a-Chip for Satellite Applications S. Azimi, B.…”

Section: Related Workmentioning

confidence: 99%

“…It is known that each gate has different SET propagation behavior related to the difference between the propagation delays of t pHL and t pLH , [8]. For investigating the SET behavior, we consider a chain of 5,652 inverters in the experiment.…”

Section: Physical Characterizationmentioning

confidence: 99%

See 2 more Smart Citations

Accurate analysis of SET effects on Flash-based FPGA System-on-a-Chip for satellite applications

Azimi

Sterpone

2016

2016 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS)

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Section: Related Workmentioning

confidence: 94%

Section: Related Workmentioning

confidence: 99%

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Accurate analysis of SET effects on Flash-based FPGA System-on-a-Chip for satellite applications

Azimi

Sterpone

2016

2016 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS)

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“…In this way SETs influence the processing speed of the clock signal dependent system [9]. Furthermore, it is well known, that errors originating from SETs are strongly dependent on the internal clock frequencies [10]. As charged particles can hit the electronic system anytime and anywhere no countermeasures except for full radiation shielding is possible.…”

Section: Single Event Transientsmentioning

confidence: 99%

Radiation effect mitigation methods for electronic systems

Kuwahara

Tomioka

Fukuda

et al. 2012

2012 IEEE/SICE International Symposium on System Integration (SII)

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Effects of space radiation on space systems have been considered as the main challenge in designing sustainable space systems, and investigations have been done about the mitigation methods against various types of radiation effects. On March 11, 2011, a massive earthquake and tsunami hit the eastern Japan, particularly Tohoku area. Since then, the Fukushima Daiichi Nuclear Power Station has been facing a crisis. To respond to this situation, Tohoku University conducted studies to redesign mobile robots for disaster response missions, and has realized the fact that there was no practical information available about the radiation effects on electronic devices to be installed on those mobile robots and the mitigation methods against them, which revealed the importance of establishing a knowledge-base about the way of designing radiation-tolerant or radiation-hard electronics systems even for terrestrial applications. Space Robotics Laboratory of Tohoku University has been conducting researches on space systems engineering and has gathered knowledge about the radiation effects on space system's electronics devices through its real-life microsatellite development and operation activities. Based on this background, this paper summarizes the general radiation effects on electronics devices and the cost-effective way of their mitigation methods, together with the application example of microsatellite systems developed by the Space Robotics Laboratory. This paper aims to contribute to establish such kind of knowledge-base together with a variety of aerospace and terrestrial engineering communities.

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“…While for SEE, the primary concern resides in the upset of its registers (state of the flip-flop) due to a particle hit, resulting in the disruption of the normal operation of the FPGA-design [Rezgui et al, 2007a[Rezgui et al, & 2007b. The new Radiation-Tolerant ProASIC3 (RT ProASIC3 or RT3P), sharing the same silicon of the Low-Power A3PL FPGAs is hardened for TID and SEE by software means in a transparent manner to the user [Rezgui et al, 2008a]. The Single Event Transients (SET) tolerance is hardened by single or duplication filtering [Shuler et al, 2005& 2006, Balasubramanian et al, 2005, Baze et al, 2006, Mavis & Eaton, 2007, Rezgui et al, 2007a and Single Event Upsets (SEU) are hardened by TMR or Error Detection and Correction (EDAC) to soft error rates less than 10 -10 upsets/bit-day and LET th larger than 40 MeV•cm 2 /mg for clock frequency up to 100 MHz.…”

Section: Introductionmentioning

confidence: 99%