Neutron single event effect test results for various SRAM memories

Thouvenot, Didier; Trochet, P.; Gaillard, R.; Desnoyers, Francois

doi:10.1109/redw.1997.629799

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A Energy Dependence1

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Cited by 8 publications

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“…Previous results on older bulk technologies ( 0.5 m) have shown similar results with a (14 MeV)/ (3 MeV) ratio greater than 200 [15]. Fig.…”

Section: A Energy Dependencesupporting

confidence: 81%

Single Event Upsets Induced by 1–10 MeV Neutrons in Static-RAMs Using Mono-Energetic Neutron Sources

Baggio

Lambert

Ferlet-Cavrois

et al. 2007

IEEE Trans. Nucl. Sci.

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The neutron-induced SEU sensitivity in the 1-10 MeV energy range is investigated using monoenergetic neutron beams at 2.5, 4, 6, and 14 MeV. Below the 0.25 m technology node, bulk technologies exhibit a relatively high sensitivity to neutrons between 4 and 6 MeV which is explained by the contribution of alpha particles coming from (n, ) reactions. In the terrestrial environment, the contribution to SER of neutrons in this energy range exceeds 10%.

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“…Previous results on older bulk technologies ( 0.5 m) have shown similar results with a (14 MeV)/ (3 MeV) ratio greater than 200 [15]. Fig.…”

Section: A Energy Dependencesupporting

confidence: 81%