Studies on SEE Characteristic and Hardening Techniques of CMOS SRAM with Sub-micro Feature Sizes

Xing-hua, He; Zhang, Cong; Zhang, Yongliang; Lü, Huanzhang

doi:10.1007/978-90-481-3660-5_33

Advanced Techniques in Computing Sciences and Software Engineering 2009

DOI: 10.1007/978-90-481-3660-5_33

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Studies on SEE Characteristic and Hardening Techniques of CMOS SRAM with Sub-micro Feature Sizes

He Xing-hua

Cong Zhang

Yongliang Zhang

et al.

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Studies on SEE Characteristic and Hardening Techniques of CMOS SRAM with Sub-micro Feature Sizes

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References 11 publications

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