Single Event Upsets Induced by 1–10 MeV Neutrons in Static-RAMs Using Mono-Energetic Neutron Sources

Abstract

The neutron-induced SEU sensitivity in the 1-10 MeV energy range is investigated using monoenergetic neutron beams at 2.5, 4, 6, and 14 MeV. Below the 0.25 m technology node, bulk technologies exhibit a relatively high sensitivity to neutrons between 4 and 6 MeV which is explained by the contribution of alpha particles coming from (n, ) reactions. In the terrestrial environment, the contribution to SER of neutrons in this energy range exceeds 10%.

Evidence of the Robustness of a COTS Soft-Error Free SRAM to Neutron Radiation

“…Table I shows a review of the SEU cross-section found in the literature focusing on commercial SRAM devices ranging from 90 to 180 nm CMOS technologies. These results were mainly extracted from works by Baggio [16], Normand [17], Hands [18], and Miller [19]. For brevity, works are called Bag07, Nor10, Han11, and Mil13 in the Table I.…”

Ionizing radiation compatibility in the MITICA neutral beam prototype

“…These numbers have been obtained considering the following values for the SEU cross sections: = 10 15 cm 2 for low-energy neutrons, = 10 14 cm 2 for high-energy neutrons and = 10 14 cm 2 for 25 MeV neutrons in devices containing 10 B [14,15]. Variations of more than one order of magnitude are possible on these values.…”

Theoretical Correlation of Broad Spectrum Neutron Sources for Accelerated Soft Error Testing

“…The first is the Weibull approximation to the cross section. While many references use the Weibull approximation to fit the neutron cross section [11], [12], [19]- [21], there is also ample data to indicate the Weibull approximation is not appropriate [13], [22]- [24]. Ibe and co-workers [1] indicate the shape of the cross section changes from a saturation behavior to an exponential-like behavior below 130 nm.…”

“…Several studies [12], [16], [20]- [22], [25] have shown non-zero neutron cross-sections below 10 MeV (i.e., 10 MeV). Therefore, needs to be updated in both IEC and JEDEC standards to reflect this behavior.…”