Neutron and Proton Characterization of Microsemi 28 nm PolarFire SONOS-Based FPGA

Rezzak, Nadia; Wang, Jih-Jong; Varela, Stephen; Bakker, Gregory; Gu, Ang Nan

doi:10.1109/nsrec.2018.8584300

Cited by 8 publications

(5 citation statements)

References 5 publications

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“…For this purpose, a set of experiments on a Commercial-Off-The-Shelf (COTS) bulk non-volatile SRAM (nvSRAM), manufactured in 130-nm process, will be firstly presented as a case study. Two recent researches also focused on studying the radiation effects of heavy ions on this very same memory [16] and on a very similar one manufactured in 28-nm process [17]. However, this work focuses on understanding the above mentioned angular effects in an analytical way.…”

Section: Introduction and Related Workmentioning

confidence: 99%

Experimental and Analytical Study of the Responses of Nanoscale Devices to Neutrons Impinging at Various Incident Angles

Korkian

Fabero

Hubert

et al. 2020

IEEE Trans. Nucl. Sci.

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In harsh radiation environments, it is well known that the angle of incidence of impinging particles against the surface of the operating devices has significant effects on their sensitivity. This paper discusses the sensitivity underestimations that are made if particle isotropy is not taken into account, by means of an analytical study made with a single event upset predictive platform. To achieve this goal, experimental results carried out with a COTS bulk 130-nm non-volatile SRAM for various incident angles on 14.2 MeV neutrons are firstly discussed. Then, a modeling tool called MUSCA-SEP3 is used to predict the sensitivity of this memory under the same environmental conditions. Predictions and experimental results will be cross-checked, therefore the feasibility of this tool will be demonstrated for testing any other incident angle. Finally, an isotropic environment and an XY SRAM array will be emulated with MUSCA in order to demonstrate that the asymmetrical cross-sections that were observed experimentally for various incidence angles are due to the underlying asymmetry of the metalization/passivation layers within the device with respect to its active silicon. Conclusions will finally be drawn as for the importance of taking into account particle isotropy in radiationground tests.

show abstract

Section: Introduction and Related Workmentioning

confidence: 99%

Experimental and Analytical Study of the Responses of Nanoscale Devices to Neutrons Impinging at Various Incident Angles

Korkian

Fabero

Hubert

et al. 2020

IEEE Trans. Nucl. Sci.

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show abstract

“…The first is a Radiation Hardened by Design (RHBD) FPGA, manufactured using the STM C65 space process. The latter is the fifth generation of non-volatile FPGA device from Microsemi built on the stateof-the-art SONOS 28nm non-volatile process technology [4].…”

mentioning

confidence: 99%

“…DSPs, Flip-Flops, RAM, PLLs, separately [5]. Several radiation test data sets for this test topology are already available in the literature for many FPGAs, including those analyzed in this article, such as the PolarFire [4], [6]. Even though this approach yields a lot of information about the sensitivity of each FE, it does not give a realistic overview of how a custom application will work.…”

mentioning

confidence: 99%

FPGA Qualification and Failure Rate Estimation Methodology for LHC Environments Using Benchmarks Test Circuits

Scialdone

Ferraro

Alía

et al. 2022

IEEE Trans. Nucl. Sci.

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When studying the behavior of a Field Programmable Gate Array (FPGA) under radiation, the most commonly used methodology consists in evaluating the SEE crosssection of its elements individually. However, this method does not allow the estimation of the device failure rate when using a custom design. An alternative approach based on benchmark circuits is presented in this article. It allows standardized application-level testing, which makes the comparison between different FPGAs easier. Moreover, it allows the evaluation of the FPGA failure rate independently from the application that will be implemented. The employed benchmark circuit belongs to the ITC'99 benchmark suite developed at Politecnico di Torino. Using the proposed methodology, the response of four FPGAs, the NG-Medium, the ProASIC3, the SmartFusion2 and the PolarFire, was evaluated under high-energy protons. Radiation tests with thermal neutrons were also conducted on the PolarFire to assess its potential sensitivity to them. Moreover, its performances in terms of TID effects have been evaluated by measuring the degradation of the propagation delay during irradiation.

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“…The obtained results demonstrate that upsets occur at a rate of 1.1 × 10 − 10 upsets/bit/s in the CRAM and 9.6 × 10 − 11 upsets/bit/s in the BRAM. Rezzak et al considered the SEE response of a 28-nm SONOS Polarfire MPF300TS FPGA, under neutrons and protons [12]. The response of this device against neutrons and protons showed immunity against SELs and no configuration upsets.…”

Section: Introductionmentioning

confidence: 99%

SEE sensitivity of a COTS 28-nm SRAM-based FPGA under thermal neutrons and different incident angles

Fabero

Korkian

Franco

et al. 2023

Microprocessors and Microsystems

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Neutron and Proton Characterization of Microsemi 28 nm PolarFire SONOS-Based FPGA

Cited by 8 publications

References 5 publications

Experimental and Analytical Study of the Responses of Nanoscale Devices to Neutrons Impinging at Various Incident Angles

Experimental and Analytical Study of the Responses of Nanoscale Devices to Neutrons Impinging at Various Incident Angles

FPGA Qualification and Failure Rate Estimation Methodology for LHC Environments Using Benchmarks Test Circuits

SEE sensitivity of a COTS 28-nm SRAM-based FPGA under thermal neutrons and different incident angles

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