Near-field imaging of radiated emission sources on printed-circuit boards

Laurin, Jean‐Jacques; Ouardhiri, Z.; Colinas, Jerome

doi:10.1109/isemc.2001.950665

Cited by 23 publications

(16 citation statements)

References 13 publications

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“…The three components of the magnetic field are obtained by rotating the probe with an angle of 90 • around the three x, y and z directions. The second probe is a balanced wire dipole that consists of two adjacent coaxial cables and a hybrid 180 • junction to balance the dipole [10]. This dipole is used to measure the tangential components of the electric field (E x and E y ).…”

Section: Methodsmentioning

confidence: 99%

Characterization of the Open-Ended Coaxial Probe Used for Near-Field Measurements in Emc Applications

Baudry¹,

Louis²,

Mazari³

2006

PIER

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Abstract-A completely automatically near-field mapping system is developed within IRSEEM (Research Institute for Electronic Embedded Systems) in order to determine electromagnetic field radiated by electronic systems. This test bench uses a 3D positioning system of the probe to make accurate measurements. The main element of this measurement tool is the probe. This paper presents a characterization of the open-ended coaxial probe which is used to measure the normal component of the electric field.

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Section: Methodsmentioning

confidence: 99%

Characterization of the Open-Ended Coaxial Probe Used for Near-Field Measurements in Emc Applications

Baudry¹,

Louis²,

Mazari³

2006

PIER

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“…A determination method of incoherent EM radiation source reconstruction method established from the experimental process was proposed [12]. A NF imaging technique offering the possibility to visualize and extract the common-mode currents from near transmission line discontinuities was presented in [13]. To realize a high resolution 2D measured fields, those techniques require an electromechanical automated test bench as developed in [5,6,14,15] for the EM NF scanning in a planar surface located in the proximity of the radiating devices.…”

Section: Introductionmentioning

confidence: 99%

Radiated Near-Field Emission Extraction on 3d Curvilinear Surfaces From 2d Data

Ravelo¹

2015

PIER M

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Abstract-This paper deals with a fast and simple computational method of 3D near-field (NF) radiation from 2D planar frequency-and time-dependent data. The established calculation method can be used to predict the electromagnetic (EM) emission from various types of electronic devices. The proposed method is originally applicable to the computation of the EM NF along the arbitrary shaped curvilinear 3D surface of multi-shape objects. The EM computation consists in the application of the planar NF-to-NF transform using plane wave spectrum. The relevance of the established method is verified with three different validation tests of analytical and practical demonstrations. The first validation is based on the analytical NF radiation from set of elementary dipoles excited by a harmonic signal. The second validation test is based on the experimented data from a hybrid active printed circuit boards (PCBs) in the frequency domain. The last validation test is performed with the measured NF data from a microstrip planar circuit in the time-domain. For all the different test cases, the plots of EM NF on arbitrary curvilinear surfaces are presented. Applications with 3D visualization or holographic surface with arbitrary geometry of EM radiation from planar data in both frequency-and time-domains confirm the effectiveness of the proposed method to predict the EM NF emission from complex PCBs. The developed 2D-to-3D computational method is particularly useful for radiated EM compatibility engineering.

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“…Near-Field (NF) measurements [11][12][13] are being recognized to be very useful in characterizing the EMC of industrial, active, or passive circuits, as witnessed by the current interest of several research laboratories in the development of near-field scanners for the study of chip-level electromagnetic compatibility [14][15][16] and by commercial availability of automatic measurement systems to identify "hot spots" of PCB currents [17].…”

Section: Introductionmentioning

confidence: 99%

Experimental Field Reconstruction of Incoherent Sources

Capozzoli¹,

Curcio²,

Liseno³

2013

PIER B

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Abstract-The problem of characterizing random sources from near-field measurements and of devising the random field sampling procedure is tackled by a stochastic approach. The presented technique is an extension of that introduced in [22] and successfully adopted to experimentally characterize deterministic (CW and multi-frequency) radiators and fields. Under the assumption that the source is wide sense stationary, quasi-monochromatic and incoherent, its intensity is reconstructed by time-domain field measurements aimed at extracting information from the mutual coherence of the acquired near-field. The linear relation between the field coherence and the source intensity is inverted by using the Singular Value Decomposition (SVD) approach, properly representing the source intensity distribution by exploiting the a priori information (e.g., its size and shape) on the radiator. The sampling of the radiated random field is devised by a singular value optimization procedure of the relevant finite dimensional linear operator. Experimental results using a slotted reverberation chamber as incoherent source assess the performance of the approach.

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Near-field imaging of radiated emission sources on printed-circuit boards

Cited by 23 publications

References 13 publications

Characterization of the Open-Ended Coaxial Probe Used for Near-Field Measurements in Emc Applications

Characterization of the Open-Ended Coaxial Probe Used for Near-Field Measurements in Emc Applications

Radiated Near-Field Emission Extraction on 3d Curvilinear Surfaces From 2d Data

Experimental Field Reconstruction of Incoherent Sources

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