Nanoscratch on single-layer MoS<sub>2</sub> crystal by atomic force microscopy: semi-circular to periodical zigzag cracks

Ye, Shili; Xu, Keying; Lei, Le; Hussain, Sabir; Pang, Fei; Liu, Xinmeng; Zheng, Zhiyue; Ji, Wei; Shi, Xinghua; Xu, Rui; Xie, Liming; Cheng, Zhihai

doi:10.1088/2053-1591/aaf14f

Cited by 11 publications

(11 citation statements)

References 22 publications

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“…The reason lies in that the low formation energy zigzag edge leads to its cracking advantage under mechanical strain in ball-milling. 38,39 We start by using EELS to confirm the existence of edge states. The schematic of EELS is illustrated in Figure 1B.…”

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Ultrafast Internal Exciton Dissociation through Edge States in MoS₂ Nanosheets with Diffusion Blocking

et al. 2022

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Edge states of two-dimensional transition-metal dichalcogenides (TMDCs) are crucial to quantum circuits and optoelectronics. However, their dynamics are pivotal but remain unclear due to the edge states being obscured by their bulk counterparts. Herein, we study the state-resolved transient absorption spectra of ball-milling-produced MoS 2 nanosheets with 10 nm lateral size with highly exposed free edges. Electron energy loss spectroscopy and first-principles calculations confirm that the edge states are located in the range from 1.23 to 1.78 eV. Upon above bandgap excitations, excitons populate and diffuse toward the boundary, where the potential gradient blocks excitons and the edge states are formed through interband transitions within 400 fs. With below bandgap excitations, edge states are slowed down to 1.1 ps due to the weakened valence orbital coupling. These results shed light on the fundamental exciton dissociation processes on the boundary of functionalized TMDCs, enabling the ground work for applications in optoelectronics and light-harvesting.

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“…It can be found that MoS 2 nanosheets are mainly surrounded by zigzag edges (marked as white, for details see Supporting Information, Figure S5). The reason lies in that the low formation energy zigzag edge leads to its cracking advantage under mechanical strain in ball-milling. , …”

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Ultrafast Internal Exciton Dissociation through Edge States in MoS₂ Nanosheets with Diffusion Blocking

et al. 2022

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“…Both FFM and TSM are derivative modes of contact AFM mode. For FFM (TSM), the scan direction of the AFM tip is perpendicular (parallel) to the long axis of the AFM cantilever, and then, the friction (shear) property of the sample was obtained by detecting the torsion signal of the cantilever, as shown in Figure S2. − For the exfoliated graphene, the unique puckering effect has been proposed to understand the increased friction force with the decreased thickness and the friction anisotropic-driven domain imaging. , This puckering effect also enabled the TSM method to successfully image orientation of the crystalline domains of CVD-grown 2D materials in the previous work . In the single-crystal WS 2 monolayer flake, three contrast domains were vaguely and clearly visualized in the FFM and TSM images, as shown in Figure d,e.…”

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Strain-Engineered Rippling and Manipulation of Single-Layer WS₂ by Atomic Force Microscopy

et al. 2021

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Surface ripple, as an important factor of corrugations in two-dimensional (2D) atomic crystals, plays important roles in determining their mechanical and physical properties. Here, we systematically investigated the strain-engineered rippling structure and manipulation of the rippling domain in monolayer WS2 flakes via atomic force microscopy (AFM). The rippling structure was introduced by the in-plane compression applied through the underlying SiO2/Si substrate during the rapid cooling process of post-growth. The zigzag-orientated rippling domains with three-equivalent directions were visualized by transverse shear microscopy (TSM) and friction force microscopy and further determined via angle-dependent TSM. Furthermore, these rippling domains can be precisely manipulated by controlling the AFM scanning, and various rippling patterns were formed by the AFM lithography. The manipulation mechanisms were phenomenally discussed based on their strain-induced anisotropic mechanical properties, the film–substrate mechanical model, and the dynamic strain-induced anisotropic puckering effects. Our study will be beneficial in understanding and controlling not only the rippling structures but also the rippling-related electronic and optical properties of 2D materials.

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“…Thus, all the directions of the head cracks are consistent with zigzag orientation in this mode. Such a unique crack form originated from the special local stress distribution around the AFM tip [177].…”

Section: Nanoscratching Using Afm Probementioning

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Advanced atomic force microscopies and their applications in two-dimensional materials: a review

Guo

et al. 2022

Mater. Futures

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Scanning probe microscopy (SPM) allows the spatial imaging, measurement, and manipulation of nano and atomic scale surfaces in real space. In the last two decades, numerous advanced and functional SPM methods, particularly atomic force microscopy (AFM), have been developed and applied in various research fields, from mapping sample morphology to measuring physical properties. Herein, we review the recent progress in functional AFM methods and their applications in studies of two-dimensional (2D) materials, particularly their interfacial physical properties on the substrates. This review can inspire more exciting application works using advanced AFM modes in the 2D and functional materials fields.

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Nanoscratch on single-layer MoS₂ crystal by atomic force microscopy: semi-circular to periodical zigzag cracks

Cited by 11 publications

References 22 publications

Ultrafast Internal Exciton Dissociation through Edge States in MoS₂ Nanosheets with Diffusion Blocking

Ultrafast Internal Exciton Dissociation through Edge States in MoS₂ Nanosheets with Diffusion Blocking

Strain-Engineered Rippling and Manipulation of Single-Layer WS₂ by Atomic Force Microscopy

Advanced atomic force microscopies and their applications in two-dimensional materials: a review

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Nanoscratch on single-layer MoS2 crystal by atomic force microscopy: semi-circular to periodical zigzag cracks

Cited by 11 publications

References 22 publications

Ultrafast Internal Exciton Dissociation through Edge States in MoS2 Nanosheets with Diffusion Blocking

Ultrafast Internal Exciton Dissociation through Edge States in MoS2 Nanosheets with Diffusion Blocking

Strain-Engineered Rippling and Manipulation of Single-Layer WS2 by Atomic Force Microscopy

Advanced atomic force microscopies and their applications in two-dimensional materials: a review

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Product

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Nanoscratch on single-layer MoS₂ crystal by atomic force microscopy: semi-circular to periodical zigzag cracks

Ultrafast Internal Exciton Dissociation through Edge States in MoS₂ Nanosheets with Diffusion Blocking

Ultrafast Internal Exciton Dissociation through Edge States in MoS₂ Nanosheets with Diffusion Blocking

Strain-Engineered Rippling and Manipulation of Single-Layer WS₂ by Atomic Force Microscopy