2015
DOI: 10.1063/1.4905507
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Nanoscale-resolved chemical identification of thin organic films using infrared near-field spectroscopy and standard Fourier transform infrared references

Abstract: We establish a solid basis for the interpretation of infrared near-field spectra of thin organic films on highly reflective substrates and provide guidelines for their straightforward comparison to standard far-field Fourier transform infrared (FTIR) spectra. Particularly, we study the spectral behavior of near-field absorption and near-field phase, both quantities signifying the presence of a molecular resonance. We demonstrate that the near-field phase spectra only weakly depend on the film thickness and can… Show more

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Cited by 99 publications
(103 citation statements)
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“…For an SiO 2 film on Si, calculations that approximate the tip as a spheroid of length 2L and radius r (r ) are often used to quantify the relative amounts of chemical species in a mixture via multivariate analysis. Although experimental validation on heterogeneous samples is needed, significant progress in relating s-SNOM spectra with far-field FTIR spectra was recently accomplished through analyses of the amplitude (A), phase, and absorption (A abs = |A|sinΦ) signals as a function of thickness in PMMA films on highly reflective substrates (Si) (102). Peak intensities in the phase spectra increased with thickness, and their positions (blue-shifted by ≈3 and 9 cm −1 with respect to far-field grazing angle and transmission spectra, respectively) are mostly insensitive to the thickness.…”
Section: Scattering Scanning Near-field Optical Microscopymentioning
confidence: 99%
“…For an SiO 2 film on Si, calculations that approximate the tip as a spheroid of length 2L and radius r (r ) are often used to quantify the relative amounts of chemical species in a mixture via multivariate analysis. Although experimental validation on heterogeneous samples is needed, significant progress in relating s-SNOM spectra with far-field FTIR spectra was recently accomplished through analyses of the amplitude (A), phase, and absorption (A abs = |A|sinΦ) signals as a function of thickness in PMMA films on highly reflective substrates (Si) (102). Peak intensities in the phase spectra increased with thickness, and their positions (blue-shifted by ≈3 and 9 cm −1 with respect to far-field grazing angle and transmission spectra, respectively) are mostly insensitive to the thickness.…”
Section: Scattering Scanning Near-field Optical Microscopymentioning
confidence: 99%
“…All spectral data had a zero-fill factor of 4, so that the final spectra were saved at a nominal spectral resolution of 2.1 cm -1 . Please do not adjust margins Please do not adjust margins spatial resolution from the complex-valued second order scattering coefficient, (σ 2 ), [26][27][28] given by equation 1:…”
Section: Sins Spectral Collectionmentioning
confidence: 99%
“…Most s-SNOM studies on organic systems probe samples that are a few tens of nanometers thick (typically less than 100 nm; Taubner et al, 2004;Atkin et al, 2012;Huth et al, 2012;Amenabar et al, 2013;Govyadinov et al, 2013;Pollard et al, 2014Pollard et al, , 2016. Despite the recent discussion about the role of sample thickness in the s-SNOM analysis of polymers (Mastel et al, 2015), we decided to focus on producing sections no thicker than 100 nm. In previous tests with samples that were fixed and embedded in LR White resin according to standard methods, such as for transmission electron microscopy, it was not possible to distinguish the cell wall from the resin spectra (data not shown).…”
Section: Sample Preparationmentioning
confidence: 99%