2015
DOI: 10.1146/annurev-anchem-071114-040435
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Infrared Imaging and Spectroscopy Beyond the Diffraction Limit

Abstract: Progress in nanotechnology is enabled by and dependent on the availability of measurement methods with spatial resolution commensurate with nanomaterials' length scales. Chemical imaging techniques, such as scattering scanning near-field optical microscopy (s-SNOM) and photothermal-induced resonance (PTIR), have provided scientists with means of extracting rich chemical and structural information with nanoscale resolution. This review presents some basics of infrared spectroscopy and microscopy, followed by de… Show more

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Cited by 237 publications
(281 citation statements)
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“…Although the laser spot was large, the sharp AFM tip served as a near-field detector by locally detecting the small thermal expansion resulting from light absorption in the sample thus conferring high lateral resolution to the measurements. The resulting spatial resolution for IR mapping has been shown to be between 50 and 100 nm depending on the response of the absorbing object 23 . All IR mappings and spectra were normalized to the incident power.…”
Section: Methodsmentioning
confidence: 99%
“…Although the laser spot was large, the sharp AFM tip served as a near-field detector by locally detecting the small thermal expansion resulting from light absorption in the sample thus conferring high lateral resolution to the measurements. The resulting spatial resolution for IR mapping has been shown to be between 50 and 100 nm depending on the response of the absorbing object 23 . All IR mappings and spectra were normalized to the incident power.…”
Section: Methodsmentioning
confidence: 99%
“…In this work, two complementary atomic force microscopy (AFM)-based optical techniques, the photothermal induced resonance (PTIR) 20, 21, 22 and a novel implementation of near-field scanning optical microscopy (NSOM), 23, 24, 25 are leveraged to characterize CdTe polycrystalline solar cells with nanoscale resolution. In PTIR, a sample placed on an optically transparent prism, is illuminated in total internal reflection geometry over a relatively large area, while an AFM tip acts as a local detector for measuring absorption spectra and maps.…”
mentioning
confidence: 99%
“…20, 21, 27 In PTIR, a pulsed wavelength-tunable laser illuminates the sample and a contact AFM tip locally transduces the sample thermal expansion induced by light absorption into mechanical cantilever motion. The cantilever oscillation is detected by reflecting a diode laser off the cantilever into the AFM four-quadrant detector (figure 1a).…”
mentioning
confidence: 99%
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“…Investigators have also used a subwavelength tip probe (91) for nanoscale measurements. Use of nanoscale imaging systems (92) in research to identify molecular changes is likely imminent, but clinical applications may not be practical in the near future.…”
Section: Molecular Digital Pathologymentioning
confidence: 99%