Abstract:Two scanning acoustic probe microscopy (SAPM) techniques have been developed for the nanoscale analysis of the interaction of acoustic modes on the surface of a solid. The scanning acoustic force microscope (SAFM) and the scanning acoustic tunneling microscope (SATM) are extensions to the scanning probe microscopy world utilizing the non-linearity of the respective interaction-distance curves in order to detect high-frequency signals, like acoustic waves or electric fields. SAFM and SATM measurements are prese… Show more
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