NAND flash storage technology for mission-critical space applications

Heavy Ion and Proton-Induced Single Event Upset Characteristics of a 3-D NAND Flash Memory

“…The advantages of commercial NAND flash are particularly attractive for satellite applications where space and weight are critical. Many space programs have started to implement stateof-the-art NAND flash in flight applications [2]− [6]. However, the commercial die does not undergo any design or process change to enhance its hardness to the space environment.…”

“…Therefore, it is critical to understand the susceptibility of the latest commercial flash memories against the relevant radiation environments and radiation effects, including but not limited to total-ionizing dose (TID), and heavy ion and proton-induced single-event effects (SEE). The radiation effects community has investigated each generation of flash technology [2]− [20]. These investigations included testing for feasibility of specific flight missions [2]- [6], research done by academic institutions [7]− [11], and technology evaluations performed by NASA, ESA, and other aerospace industries [12]− [20].…”

“…The radiation effects community has investigated each generation of flash technology [2]− [20]. These investigations included testing for feasibility of specific flight missions [2]- [6], research done by academic institutions [7]− [11], and technology evaluations performed by NASA, ESA, and other aerospace industries [12]− [20]. Notably, the publications on this topic included an early paper in 1997 on a 16 Mbit NOR and a NAND flash [19].…”

“…The innovation of the 3D NAND can potentially introduce new mechanisms or shift the significance of known effects. Traditionally, SEU in flash has been manageable at a system level with a basic error detection and correction (EDAC) algorithm, given the relatively low SEU rate and the typically extremely low multiple-bit upset (MBU) sensitivity [2], [3] [6], [8], [21]. The 3D structure can potentially alter the SEU characteristics.…”

Intelligent Garbage Collection Policy Based on I/O Workload Prediction for NAND Flash-based Storage Devices

“…Therefore, it is usually used as data storage medium for desktop computers and consumer electronics. As NAND flash memory increases in storage capacity and decreases in cost-per-bit continuously, NAND flash memory is introduced by enterprises to store data for servers, especially for read intensive applications [13]. As shown in Figure 1, a NAND flash memory chip is composed of a fixed number of blocks.…”