MUSCA SEP³ contributions to investigate the direct ionization proton upset in 65nm technology for space, atmospheric and ground applications

Abstract

This paper presents the investigation of upset induced by direct ionisation of proton in 65nm technology and evaluates the operational SER consequences in space, atmospheric and ground environments.Index Terms -direct ionization of proton, operational SER, nanometric technology, space -atmospheric -ground applications.

Impact of scaling on the soft error sensitivity of bulk, FDSOI and FinFET technologies due to atmospheric radiation

“…As feature sizes scale down, charge collection at multiple nodes (i.e., charge sharing) due to a single particle hit result from the decrease in spacing dimensions between cells [4][5][6][7]. The sensitivity of the SEE is expected to increase and recent studies have demonstrated the occurrence of SEs due to protons [8,9] and muons [10] for advanced nano-scale electronics.…”

“…Investigations were performed and validated in several scientific fields, such as operational calculations [23,24], nano-scale technologies (bulk, FDSOI [10] and FinFET [25]) and the design impact on SEE responses [26], transport/ collection models [27] and emerging problematic issues (direct ionizing protons [9] and muons). Significant works have additionally investigated the contribution of the radial ionization profile of SEE modeling [10][11][12].…”

Atmospheric radiation environment analyses based-on CCD camera at various mountain altitudes and underground sites

“…As feature sizes scales down, charge collection at multiple nodes (i.e., charge sharing) due to a single particle hit results from the decrease spacing dimensions between cells [12][13][14][15]. Then the sensitivity to SEE is expected to increase and recent studies have shown the occurrence of soft-errors due to protons [16,17] and to muons [18] for advanced nano-scales electronics. In order to know the muon contribution in soft-errors, the first requirement is to ensure a solid understanding of the muon radiation environment.…”

Criticality of Low-Energy Protons in Single-Event Effects Testing of Highly-Scaled Technologies

“…Initial information was presented by Heidel et al [6] and was expanded by Sierawski et al [2], Cannon et al [4], and Hubert et al [3]. A lot of this debate centered on whether experimenters had to use degraded beams of low-energy protons with significant straggle or, since primary particle direct ionization was the assumed mechanism, whether a surrogate beam of alpha particles or other low-linear energy transfer (LET) light ions could be utilized to simulate the low-energy protons' electronic LET and thus the correct proportion of SEUs with enough fidelity to make accurate event rate calculations.…”