2015
DOI: 10.1016/j.vlsi.2015.01.003
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Impact of scaling on the soft error sensitivity of bulk, FDSOI and FinFET technologies due to atmospheric radiation

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Cited by 91 publications
(55 citation statements)
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References 32 publications
(42 reference statements)
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“…Compared to other published work [15], we used a full Monte Carlo approach for the assessment of both monoenergetic cross sections and SEE rate as well as the primary particle spectra in different radiation environments. FLUKA Monte Carlo simulation was used to study the energy deposition in the SRAM model and to transport particle spectra previously assessed in different radiation environments such as the terrestrial environment, commercial flight altitude, LHC critical areas for electronics and CERN's CHARM test facility.…”
Section: Discussionmentioning
confidence: 99%
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“…Compared to other published work [15], we used a full Monte Carlo approach for the assessment of both monoenergetic cross sections and SEE rate as well as the primary particle spectra in different radiation environments. FLUKA Monte Carlo simulation was used to study the energy deposition in the SRAM model and to transport particle spectra previously assessed in different radiation environments such as the terrestrial environment, commercial flight altitude, LHC critical areas for electronics and CERN's CHARM test facility.…”
Section: Discussionmentioning
confidence: 99%
“…The need to investigate the SEE beyond the "classical" vision that only certain kind radiation fields may have a significant impact on the technology currently available, was considered in [10]. QARM [11], [12] and EXPACS [13], [14] codes were extensively used in the past [10] to assess particle spectra in the atmospheric and terrestrial environments, but a systematic evaluation of the different particle contribution to the total SEE rate, in a given environment, has been investigated only in a few publications [15]. In [15] spectra from QARM and EXPACS were used as primary source to investigate the impact of terrestrial radiation on soft error.…”
Section: Introductionmentioning
confidence: 99%
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“…As feature sizes scales down, charge collection at multiple nodes (i.e., charge sharing) due to a single particle hit results from the decrease spacing dimensions between cells [12][13][14][15]. Then the sensitivity to SEE is expected to increase and recent studies have shown the occurrence of soft-errors due to protons [16,17] and to muons [18] for advanced nano-scales electronics. In order to know the muon contribution in soft-errors, the first requirement is to ensure a solid understanding of the muon radiation environment.…”
Section: Background and Contextmentioning
confidence: 99%
“…[Cre13] have shown resistance to radiation effects. Modern technologies such as FinFETs have also proved being a good alternative to bulk technologies for radiation sensitive applications [HAR15].…”
Section: Radiation Hardened By Processmentioning
confidence: 99%