2017
DOI: 10.1021/acsami.7b14616
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Multimodal Kelvin Probe Force Microscopy Investigations of a Photovoltaic WSe2/MoS2 Type-II Interface

Abstract: Atomically thin transition-metal dichalcogenides (TMDC) have become a new platform for the development of next-generation optoelectronic and light-harvesting devices. Here, we report a Kelvin probe force microscopy (KPFM) investigation carried out on a type-II photovoltaic heterojunction based on WSe monolayer flakes and a bilayer MoS film stacked in vertical configuration on a Si/SiO substrate. Band offset characterized by a significant interfacial dipole is pointed out at the WSe/MoS vertical junction. The p… Show more

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Cited by 60 publications
(52 citation statements)
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“…measured the surface potential image of the WSe 2 /MoS 2 van der Waals heterojunction using KPFM, from which the band alignment at the monolayer interface was obtained. They confirmed the impact of the defects to the photocarrier generation and the diffusion of negative charges near the heterojunction as well as the OCP value [115], by the surface photovoltage (SPV) image observation. Li et al demonstrated the more efficient charge separation of photogenerated carriers in n-Si/MoS 2 compared to that in p-Si/MoS 2 by using KFM.…”
Section: Optical Spectroscopysupporting
confidence: 53%
“…measured the surface potential image of the WSe 2 /MoS 2 van der Waals heterojunction using KPFM, from which the band alignment at the monolayer interface was obtained. They confirmed the impact of the defects to the photocarrier generation and the diffusion of negative charges near the heterojunction as well as the OCP value [115], by the surface photovoltage (SPV) image observation. Li et al demonstrated the more efficient charge separation of photogenerated carriers in n-Si/MoS 2 compared to that in p-Si/MoS 2 by using KFM.…”
Section: Optical Spectroscopysupporting
confidence: 53%
“…Layered materials such as NbSe2 and WSe2 which can be mechanically exfoliated to produce twodimensional (2D) semiconductor samples have long been attractive to researchers using STM to study defects since cleavage provides a straightforward means of producing clean, atomically-flat surfaces [132]. As the popularity of 2D materials has increased, so has the breadth of SPM studies, expanding to encompass not only mechanically exfoliated samples but also materials grown by chemical vapour deposition [133]. Furthermore, a wide range of SPM techniques have been applied, including C-AFM (which can resolve atomic-scale periodicity in samples imaged under a dry nitrogen atmosphere [134]), KPFM and differential surface photovoltage microscopy [133].…”
Section: Addressing the Electrical Properties Of Defects In 2d Transimentioning
confidence: 99%
“…As the popularity of 2D materials has increased, so has the breadth of SPM studies, expanding to encompass not only mechanically exfoliated samples but also materials grown by chemical vapour deposition [133]. Furthermore, a wide range of SPM techniques have been applied, including C-AFM (which can resolve atomic-scale periodicity in samples imaged under a dry nitrogen atmosphere [134]), KPFM and differential surface photovoltage microscopy [133]. STM remains, however, an extremely powerful approach to the identification of defects in 2D materials and the assessment of their impact on electronic structure.…”
Section: Addressing the Electrical Properties Of Defects In 2d Transimentioning
confidence: 99%
“…Recently, as the popularity of TMDs has grown up, new tactics have been continuously developed. Mostly, lateral and vertical heterojunctions formed by TMDs and other 2DMs have been regarded as a promising way to obtain novel devices . Thus far, graphene/MoS 2 ‐ or /WS 2 ‐ or WSe 2 ‐based photodetectors have been reported .…”
Section: Optoelectronic Devicesmentioning
confidence: 99%