2022
DOI: 10.1016/j.vacuum.2022.111299
|View full text |Cite
|
Sign up to set email alerts
|

Multifactorial investigations of the deposition process – Material property relationships of ZnO:Al thin films deposited by magnetron sputtering in pulsed DC, DC and RF modes using different targets for low resistance highly transparent films on unheated substrates

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

1
4
0

Year Published

2022
2022
2024
2024

Publication Types

Select...
6

Relationship

1
5

Authors

Journals

citations
Cited by 6 publications
(5 citation statements)
references
References 20 publications
1
4
0
Order By: Relevance
“…This effect is due to the absorption of photons by free electrons (Drude absorption), and is an indicator of the good electrical conductivity of the manufactured films. The resistivity of the fabricated AZO film was 2.6 × 10 −3 Ω•cm, a value comparable to those reported in the literature (e.g., [46]). One of the parameters indicating the good properties of the material as a transparent oxide conductor is the so-called FOM (figure of merit), which takes into account both transparency and conductivity.…”
Section: Optical and Electrical Propertiessupporting
confidence: 87%
“…This effect is due to the absorption of photons by free electrons (Drude absorption), and is an indicator of the good electrical conductivity of the manufactured films. The resistivity of the fabricated AZO film was 2.6 × 10 −3 Ω•cm, a value comparable to those reported in the literature (e.g., [46]). One of the parameters indicating the good properties of the material as a transparent oxide conductor is the so-called FOM (figure of merit), which takes into account both transparency and conductivity.…”
Section: Optical and Electrical Propertiessupporting
confidence: 87%
“…EgAZO$E_{\text{g}}^{\text{AZO}}$ is significantly higher than the value for bulk ZnO of 3.32 eV, due to the very high free carrier concentration in our AZO films. [ 13 ] The transmission electron microscopy (TEM) images (Figure 2c–d) show that the AZO layer deposited onto the (001) β ‐Ga 2 O 3 epitaxial layer possesses a hexagonal, polycrystalline structure in the form of columns perpendicular to the surface. The ITO layer grows on the (001) β ‐Ga 2 O 3 epilayer in form of grains extending throughout the whole thickness of the layer.…”
Section: Resultsmentioning
confidence: 99%
“…100 W DC power. [13] The surface of the samples was cleaned by a HCl solution prior to Schottky contact deposition. As a final step annealing at 300 °C in the air on a hotplate was applied to improve current-voltage characteristics of the devices.…”
Section: Methodsmentioning
confidence: 99%
See 1 more Smart Citation
“…However, an additional advantage is the possibility of the preparation of p-type transparent conductive coatings using in situ doping of ZnO during its deposition [ 6 ]. The form type and dimensions of ZnO nanostructures have a strong impact on its features as well [ 7 , 8 , 9 ]. All of the listed properties and additionally the high thermal and mechanical stability at room temperature make it attractive for potential use in electronics, optoelectronics and laser technology [ 10 ].…”
Section: Introductionmentioning
confidence: 99%