Multi-histogram ADC BIST System for ADC Linearity Testing

Chan, Koay Soon; Nordin, Nuzrul Fahmi; Chan, Kim Chon; Lok, Terk Zyou; Yong, Chee Wai

doi:10.1109/ats.2013.47

Cited by 6 publications

(3 citation statements)

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“…For highprecision devices, these requirements are very challenging. Especially for built-in self-test [10,11,12,13,14,15], due to the limitation of chip area, it is difficult to integrate a high-performance signal generator. Therefore, there is a strong need to develop more efficient and practical testing algorithms.…”

Section: Introductionmentioning

confidence: 99%

Accurate spectral testing algorithm of ADC with amplitude drift

Zhong

Song

et al. 2022

IEICE Electron. Express

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A new spectral testing algorithm is proposed to estimate the dynamic parameters accurately when the signal source suffers the amplitude drift. The output data of the Analog-to-Digital Converter (ADC) under test are divided into several segments. By estimating original fundamental via the Least squares method and reconstructing a non-drift fundamental to replace it, the new data are reconstructed without amplitude drift and hence the spectral leakage is removed. Extensive simulation results and algorithm analysis validate the functionality and robustness of the proposed method. The comparison with other state-of-the-art methods is also presented. The proposed algorithm relaxes the stringent requirement of the test environment, and reduces the test cost significantly.

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Section: Introductionmentioning

confidence: 99%

Accurate spectral testing algorithm of ADC with amplitude drift

Zhong

Song

et al. 2022

IEICE Electron. Express

View full text Add to dashboard Cite

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“…As in the process for calculating the offset fault, we can identify six transition points at which the output changes. They are determined by the expressions in (6). The length of each section where the values are "00," "01," and "10" representing the results of sub-histogram are calculated mathematically as shown in (7).…”

Section: Calculation Of Pipeline Stage Faultsmentioning

confidence: 99%

“…This test method can precisely measure test performance through the large code bin width. However, its disadvantages include a long test time and the necessity of large amounts of test data [6,7]. To solve these problems, many reduced-code test methods have been proposed.…”

Section: Introductionmentioning

confidence: 99%

Reduced-code test method using sub-histograms for pipelined ADCs

Son

Jang

Kim

et al. 2015

IEICE Electron. Express

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The measurement of static test parameters for an analog-todigital converter (ADC) requires a large volume of test data, especially for a high-resolution ADC. This paper proposes a reduced-code test method for pipelined ADCs that does not compromise test accuracy. The proposed method calculates fault information at each stage by using sub-histograms. The simulation results based on 12-bit pipelined ADCs show a maximum integral nonlinearity error of 0.590 LSB with only 3.92% of the codes required for the conventional histogram-based method.

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ADC built-in-self-test based on a pseudorandom uniform noise generator

Evans

2014

Design of Circuits and Integrated Systems

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This paper describes a digital built-in-self-test (BIST) solution to ADC dynamic performance testing. The proposed ADC BIST system is based in a uniform histogram approach to test the linearity of ADCs. A pipeline ADC with a resolution of 10 bits, a DAC with the same resolution as the ADC under test and the proposed BIST scheme were modeled and simulated in MATLAB to prove its validity. Several 32 bits pseudorandom uniform noise generators were evaluated. When compared with the Gaussian histogram approach, the obtained results show that the error on the maximum INL is 0.13 LSB for the Mersenne twister pseudorandom uniform noise generator and an adequate statistical significance is obtained with a quarter of the samples. Additionally, the number and complexity of the circuits are reduced.

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Multi-histogram ADC BIST System for ADC Linearity Testing

Cited by 6 publications

References 0 publications

Accurate spectral testing algorithm of ADC with amplitude drift

Accurate spectral testing algorithm of ADC with amplitude drift

Reduced-code test method using sub-histograms for pipelined ADCs

ADC built-in-self-test based on a pseudorandom uniform noise generator

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