Monte Carlo simulation of X-ray spectra from low energy electrons using optical data

Roet, D.; Espen, P. Van

doi:10.1016/j.nimb.2010.07.004

Cited by 3 publications

(2 citation statements)

References 26 publications

(21 reference statements)

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“…For details about the calculation of the elastic scattering cross section, see, for example, while, for the energy loss mechanisms, see . The Monte Carlo method used in this study was described in many papers, both assuming the continuous slowing down approximation and using the energy straggling strategy . Therefore, a very short summary of the procedure utilized in the present context will be provided, in which a scheme based on the continuous slowing down approximation only is used.…”

Section: Monte Carlo Schemementioning

confidence: 99%

Backscattered electrons from gold surface films deposited on silicon substrates: a joint experimental and computational investigation to add new potentiality to electron microscopy

Dapor

Bazzanella

Toniutti

et al. 2012

Surface & Interface Analysis

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This paper addresses the problem of the thickness determination of thin gold overlayers deposited on silicon bulk substrates by looking at the electron backscattering coefficient involved in scanning electron microscopy (SEM). A Monte Carlo code, used to calculate the backscattering coefficient, together with a simple experimental setup, which uses a conventional SEM, allow to determine thin film thickness (in the range 25-200 nm) with an estimated accuracy of 20%. This adds obviously new potentiality to SEM.

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Section: Monte Carlo Schemementioning

confidence: 99%

Backscattered electrons from gold surface films deposited on silicon substrates: a joint experimental and computational investigation to add new potentiality to electron microscopy

Dapor

Bazzanella

Toniutti

et al. 2012

Surface & Interface Analysis

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“…Precise line shape representation is one of the essential parts of accurate energy and intensity determination in X-ray spectrum analysis. Much research work has dealt with analytic functions for gamma and X-ray spectrum analysis by the least-square method [1][2][3][4][5]. One purpose of them is to outline a method to generate the response function of the detector.…”

Section: Introductionmentioning

confidence: 99%

Statistical distribution based detector response function of a Si(PIN) detector for K _α and K _β X-ray

Tuo

Yang

et al. 2013

Chinese Phys. C

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FXRS: Fast X-Ray Spectrum-Simulator Theory and Software Implementation

Chirilă

2017

Commun. Comput. Phys.

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We propose a simple, computationally efficient scheme for an X-ray spectrum simulator. The theoretical models describing the physical processes involved are employed in our Monte Carlo software in a coherent way, paving the way for straightforward future improvements. Our results compare satisfactorily to experimental results from literature and to results from dedicated simulation software. The simplicity, excellent statistical errors, and short execution time of our code recommend it for intensive use in X-ray generation simulations.

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Monte Carlo simulation of X-ray spectra from low energy electrons using optical data

Cited by 3 publications

References 26 publications

Backscattered electrons from gold surface films deposited on silicon substrates: a joint experimental and computational investigation to add new potentiality to electron microscopy

Backscattered electrons from gold surface films deposited on silicon substrates: a joint experimental and computational investigation to add new potentiality to electron microscopy

Statistical distribution based detector response function of a Si(PIN) detector for K _α and K _β X-ray

FXRS: Fast X-Ray Spectrum-Simulator Theory and Software Implementation

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Monte Carlo simulation of X-ray spectra from low energy electrons using optical data

Cited by 3 publications

References 26 publications

Backscattered electrons from gold surface films deposited on silicon substrates: a joint experimental and computational investigation to add new potentiality to electron microscopy

Backscattered electrons from gold surface films deposited on silicon substrates: a joint experimental and computational investigation to add new potentiality to electron microscopy

Statistical distribution based detector response function of a Si(PIN) detector for K α and K β X-ray

FXRS: Fast X-Ray Spectrum-Simulator Theory and Software Implementation

Contact Info

Product

Resources

About

Statistical distribution based detector response function of a Si(PIN) detector for K _α and K _β X-ray