Statistical distribution based detector response function of a Si(PIN) detector for K _α and K _β X-ray

Abstract

Statistical distribution based detector response function ofa Si(PIN) detector for K α and K β X-ray * LI Zhe( ) 2;2) TUO Xian-Guo( ) 1,3;1) YANG Jian-Bo( ) 2 LIU Ming-Zhe( ) 1 CHENG Yi( ) 2 WANG Lei( ) 2

Prompt gamma neutron activation analysis for multi-element measurement with series samples

“…Prompt gamma neutron activation analysis (PGNAA), a non-destructive, high-efficiency and multi-element nuclear analysis technology, is widely used in industries such as cement, coal, chemical, building material, mining and metallurgy, and has strong technical advantages and economic benefits compared with traditional chemical analysis and sampling laboratory analysis. It has become an important analysis technology in modern industrial production processes [1][2][3][4][5][6][7][8][9][10][11][12][13][14][15]. In this paper we use the on-line PGNAA system at Chengdu University of Technology to measure a series of prepared experimental samples and obtain the characteristic γ -rays of all elements so as to analyze the relations of those characteristic γ -rays to further confirm the content of each element.…”