2013
DOI: 10.1063/1.4804104
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Monte Carlo semi-empirical model for Si(Li) x-ray detector: Differences between nominal and fitted parameters

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Cited by 3 publications
(4 citation statements)
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“…On the other hand, since the surveyed detector was manufactured in 2007, changing the dead layers' thicknesses due to aging was assumed as the cause of this deviation. This assumption is in accordance with [10][11][12][13][14]. Therefore, all other parameters were kept as fixed and the thicknesses of the front and rear dead layers were adjusted to reproduce the experimental efficiencies.…”
Section: Monte Carlo Simulationmentioning
confidence: 91%
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“…On the other hand, since the surveyed detector was manufactured in 2007, changing the dead layers' thicknesses due to aging was assumed as the cause of this deviation. This assumption is in accordance with [10][11][12][13][14]. Therefore, all other parameters were kept as fixed and the thicknesses of the front and rear dead layers were adjusted to reproduce the experimental efficiencies.…”
Section: Monte Carlo Simulationmentioning
confidence: 91%
“…In recent years, the use of the Monte Carlo technique to simulate the efficiency of a detector in x-and γ-ray spectroscopy has become extensively popular [1][2][3][4][5][6][7][8][9]. However, some inconsistencies between the simulated and the experimental efficiencies have been reported in the literature [10][11][12][13][14], for many types of detectors. A potential explanation for this issue can be categorized as follows:…”
Section: Introductionmentioning
confidence: 99%
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“…Characterization of a Si(Li) spectrometer has been reported by several authors, e.g. [3] and [4], exploiting different techniques. In the presented paper, description of the detector was performed by using X-ray radiography with a film and with a Timepix detector.…”
Section: Jinst 13 P01021mentioning
confidence: 99%