2021
DOI: 10.1021/acsami.1c09553
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Molecular Understanding of Fouling Induction and Removal: Effect of the Interface Temperature on Milk Deposits

Abstract: Molecular details concerning the induction phase of milk fouling on stainless steel at an elevated temperature range were established to better understand the effect of temperature on surface fouling during pasteurization. The liquid–solid interface that replicates an industrial heat exchanger (≤75°C), including four stages (preheating, heating, holding, and cooling), was investigated using both a quartz crystal microbalance (QCM-D) and a customized flow cell. We found that the milk fouling induction process i… Show more

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Cited by 20 publications
(19 citation statements)
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“…For thickness measurements, an AFM nanoindentation or scratching technique was employed . Using contact mode, a defined deflection force was applied to the NCHV-A cantilever resulting in a contact force of ∼62 μN for 20 s at 1 Hz with a 90 μm scan size.…”
Section: Methodsmentioning
confidence: 99%
See 3 more Smart Citations
“…For thickness measurements, an AFM nanoindentation or scratching technique was employed . Using contact mode, a defined deflection force was applied to the NCHV-A cantilever resulting in a contact force of ∼62 μN for 20 s at 1 Hz with a 90 μm scan size.…”
Section: Methodsmentioning
confidence: 99%
“…For thickness measurements, an AFM nanoindentation or scratching technique was employed. 20 Using contact mode, a defined deflection force was applied to the NCHV-A cantilever resulting in a contact force of ∼62 μN for 20 s at 1 Hz with a 90 μm scan size. This resulted in the complete penetration of the foulant layer as indicated by the visibility of the SS surface after 20 s of contact with the surface.…”
Section: Atomic Force Microscopy (Afm)mentioning
confidence: 99%
See 2 more Smart Citations
“…For thickness measurements, contact mode AFM was used to nanomechanically remove the foulant using NSC15/Hard/Al BS tips (MikroMasch, Sofia, Bulgaria, k = 40 N/m, f 0 = 325 kHz). 29 Scan parameters during contact mode included a scan size of 90 μm, aspect ratio of 10, speed of 1 Hz, scan angle of 90°, and ∼70−120 s of contact time. Contact time was varied based on the time required to create a clean scratch.…”
Section: Atomic Force Microscopy (Afm)mentioning
confidence: 99%