2002
DOI: 10.1143/jjap.41.1012
|View full text |Cite
|
Sign up to set email alerts
|

Molecular Beam Epitaxial Growth and Characterization of GaAs1-ySbyLayers on (111)B InP Substrates

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

1
4
0

Year Published

2002
2002
2021
2021

Publication Types

Select...
7

Relationship

1
6

Authors

Journals

citations
Cited by 15 publications
(5 citation statements)
references
References 4 publications
1
4
0
Order By: Relevance
“…One thing worth to note for the samples grown at 550 1C is that the Sb composition of (1 1 1)B GaAsSb is higher than that of (1 0 0) GaAsSb. Similar effect has also been observed in GaAsSb latticematched to InP [13]. The higher Sb incorporation efficiency could be due to the longer surface lifetime of Sb adatom on (1 1 1)B plane.…”
Section: Resultssupporting
confidence: 76%
“…One thing worth to note for the samples grown at 550 1C is that the Sb composition of (1 1 1)B GaAsSb is higher than that of (1 0 0) GaAsSb. Similar effect has also been observed in GaAsSb latticematched to InP [13]. The higher Sb incorporation efficiency could be due to the longer surface lifetime of Sb adatom on (1 1 1)B plane.…”
Section: Resultssupporting
confidence: 76%
“…The growth rate of the GaAsSb was 0.70 mm/h. The Sb composition of y is 0.49 for the GaAs 1Ày Sb y on the (0 0 1) InP, which is nearly lattice matched to the (0 0 1) InP substrate [6,12,13].…”
Section: Methodsmentioning
confidence: 99%
“…These are evidence of efficient passivation of surface states by the GaAs shell that enhance the PL intensity. ,, However, the Te-doped samples exhibited a red shift of ∼120 meV with respect to the intrinsic sample at 4 K. The GaAs passivation leads to a slight blue shift in PL peak of the sample I compared to H, speculated to arise from the compressive strain at the core–shell interface of the NWs . The increase in PL and red shift in Te-doped samples could be viewed as confirmation of n-type doping leading to compensation of defects , and broadening of donor levels leading to the donor to acceptor transitions at lower energy …”
Section: Resultsmentioning
confidence: 86%
“…35,55,56 However, the Te-doped samples exhibited a red shift of ∼120 meV with respect to the intrinsic sample at 4 K. The GaAs passivation leads to a slight blue shift in PL peak of the sample I compared to H, speculated to arise from the compressive strain at the core−shell interface of the NWs. 57 The increase in PL and red shift in Te-doped samples could be viewed as confirmation of n-type doping leading to compensation of defects 58,59 and broadening of donor levels leading to the donor to acceptor transitions at lower energy. 60 The NWs were also characterized by Raman spectra (Figure 11a) to evaluate the NW growth-induced modifications of plasma-treated graphene.…”
Section: ■ Results and Discussionmentioning
confidence: 98%