2007
DOI: 10.1016/j.jcrysgro.2006.11.125
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Atomic arrangement in a CuPt-B-type ordered GaAsSb layer grown by molecular beam epitaxy observed by cross sectional scanning tunneling microscope

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Cited by 2 publications
(1 citation statement)
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“…Therefore, we identify the bright protrusions, which are seen on all the sidewalls when an InAs 1−x Sb x segment is grown, as Sb atoms. We note that the contrast of Sb atoms in comparison with As atoms is consistent with previous cross-sectional STM studies of antimonide-based alloys [53][54][55][56]. The rather constant contrast height between all the bright atoms with respect to the As sublattice indicates that only the Sb atoms belonging to the surface layer are observed.…”
Section: Surface and Overgrowth Compositionsupporting
confidence: 90%
“…Therefore, we identify the bright protrusions, which are seen on all the sidewalls when an InAs 1−x Sb x segment is grown, as Sb atoms. We note that the contrast of Sb atoms in comparison with As atoms is consistent with previous cross-sectional STM studies of antimonide-based alloys [53][54][55][56]. The rather constant contrast height between all the bright atoms with respect to the As sublattice indicates that only the Sb atoms belonging to the surface layer are observed.…”
Section: Surface and Overgrowth Compositionsupporting
confidence: 90%