1999
DOI: 10.1063/1.123522
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Modified Stranski–Krastanov growth in stacked layers of self-assembled islands

Abstract: In a stack of vertically aligned Stranski–Krastanov grown islands, the critical thickness for planar growth for all but the initial dot layer is reduced, if the thickness of the spacer layer ts is smaller than a certain value t0. We present structural and photoluminescence results on the basis of the extensively studied lattice-mismatched material system Si/Ge.

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Cited by 167 publications
(90 citation statements)
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“…Here we apply the general results derived above to periodic strained/spacer structure studied in many experiments, [9][10][11][12][13][14][15][16]18 for which, all the strained layers (odd-numbered) consist of the same material A, with the same deposition rate v A and average thickness l A , and the thickness of each spacer layer (even-numbered) is fixed as l B . Thus, from Eq.…”
Section: B Results: Kinetic Critical Thicknessmentioning
confidence: 99%
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“…Here we apply the general results derived above to periodic strained/spacer structure studied in many experiments, [9][10][11][12][13][14][15][16]18 for which, all the strained layers (odd-numbered) consist of the same material A, with the same deposition rate v A and average thickness l A , and the thickness of each spacer layer (even-numbered) is fixed as l B . Thus, from Eq.…”
Section: B Results: Kinetic Critical Thicknessmentioning
confidence: 99%
“…(Typical Ge layers are rather thin and usually expressed in units of monolayers, while the Si spacer layers are relatively thick and appropriately expressed in nanometers, as in experiments. [14][15][16] We use the conversion 1 ML = 0.1457 nm for Ge monolayers 15 in our calculations.) For surface mobility Γ k , the definitive measurement of its absolute value over a range of temperature is lacking, and we determine it from the expression of single-layer result:…”
Section: B Results: Kinetic Critical Thicknessmentioning
confidence: 99%
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