Third International Workshop on Integrated Nonlinear Microwave and Millimeterwave Circuits
DOI: 10.1109/inmmc.1994.512517
|View full text |Cite
|
Sign up to set email alerts
|

Modelling of bias dependent 1/f-noise in GaAs-MESFETs

R. Hanneberger
1
,
B. Roth
2
,
A. Beyer
3
Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Publication Types

Select...
2

Relationship

0
2

Authors

Journals

citations
Cited by 2 publications
(1 citation statement)
references
References 1 publication
0
1
0
Order By: Relevance
“…Further, novel nonlinear noise and electrothermal models for transistors were presented between 1992 and 1998 [47][48][49][50].…”
Section: Black-box Modeling Techniquesmentioning
confidence: 99%

Recent developments in nonlinear network design: Overview of integrated nonlinear microwave and millimeter-wave circuits workshop

Beyer
1
2002
Int J RF and Microwave Comp Aid Eng
0
0
0
0
View full textAdd to dashboardCite
“…Further, novel nonlinear noise and electrothermal models for transistors were presented between 1992 and 1998 [47][48][49][50].…”
Section: Black-box Modeling Techniquesmentioning
confidence: 99%

Recent developments in nonlinear network design: Overview of integrated nonlinear microwave and millimeter-wave circuits workshop

Beyer
1
2002
Int J RF and Microwave Comp Aid Eng
0
0
0
0
View full textAdd to dashboardCite

Improved HEMT model for low phase-noise InP-based MMIC oscillators

Schreurs
1
,
Meer2,
Zanden
3
et al. 1998
IEEE Trans. Microwave Theory Techn.
8
0
3
0
View full textAdd to dashboardCite
scite logo

scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.

Contact Info

customersupport@researchsolutions.com

10624 S. Eastern Ave., Ste. A-614

Henderson, NV 89052, USA

Product
Browser ExtensionAssistant by sciteCitation Statement SearchReference CheckVisualizationsDashboardsExplore JournalsExplore OrganizationsExplore FundersEmbedding BadgeEmbedding Citation SearchPricing
Resources
BlogHelp & FAQAccessibility StatementAPI TermsFor Universities & GovernmentsFor ResearchersFor PublishersFor Corporate, Pharma & EnterpriseAuthor MarketingBecome an AffiliateGet an organization trial or quotescite Data & Services
About
News & PressCareersRead our PaperCoverage

BlogTerms and ConditionsAPI TermsPrivacy PolicyContactCookie PreferencesDo Not Sell or Share My Personal Information

Copyright © 2024 scite LLC. All rights reserved.

Made with 💙 for researchers

Part of the Research Solutions Family.